Qualcomm Incorporated

Tongyu Song

Dongwon Seo

Derui Kong

Dinesh Jagannath Alladi

Lennart Karl Mathe

Xiaohong Quan

Shahin Mehdizad Taleie

Ganesh Saripalli

Jeffrey Mark Hinrichs

Honghao Ji

Sang Min Lee

Yang You

A DC-coupled buffer is provided with two switch transistors controlled by a delayed version of an output signal for the DC-coupled buffer. A first one of the switch transistors functions to cut off a current discharged into ground that would otherwise flow while an input signal for the DC-coupled buffer is discharged. A remaining second one of the switch transistors functions to increase the operating speed of the DC-coupled buffer.

High-speed low-power level-shifting clock buffer

A voltage regulator includes a band limited reference voltage. The band limited reference voltage is generated from a supply voltage combined with a feedback path to provide a band reject power supply rejection ratio (PSRR). The voltage regulator also includes a feedforward path to extend the band reject PSRR.

Low-dropout regulator with band-reject power supply rejection ratio for phase locked loop voltage controlled oscillator

A method and apparatus for attenuating transmit digital to analog converter (DAC) spurs is provided. The method begins when a reference voltage is injected into an amplifier. Next, an output of the ground low drop-out regulator is measured and is them compared with the reference voltage. The output of the amplifier is then adjusted based on the results of the comparison. If the reference voltage is higher then the output of the ground low drop-out regulator the output of the amplifier is adjusted to ground. If the reference voltage is lower than the output of the ground low drop-out regulator then the output of the amplifier is adjusted to match the reference voltage.

Transmit digital to analog converter (DAC) spur attenuation

In an aspect of the disclosure, a method and an apparatus are provided for calibrating a DAC. The apparatus calibrates a first DAC element, provides a residual current error resulting from the calibration, the residual current error being a difference between a calibrated current source of the first DAC element and a reference current source, stores the residual current error of the calibrated first DAC element in a first memory module using at least first and second storage elements coupled to a differential amplifier, and calibrates a second DAC element using the stored residual current error.

Residual error sampling and correction circuits in INL DAC calibrations

A digital-to-analog converter (DAC) includes, in part, a multitude of input stages that supply currents to a pair of current summing nodes in response to a digital signal, and an impedance attenuator coupled between the current summing nodes and the output of the DAC. The impedance attenuator is adapted, among other function, to increase the range of impedances of the output load, to account for changes in the output load impedance due to variations in the process, voltage and temperature, and to decouple the impedances seen by the summing nodes from the load impedance. The impedance attenuator further includes a differential-input, differential-output amplifier with programmable common-mode gain bandwidth to control the harmonic distortion of the amplifier. The impedance attenuator optionally includes a pair of cross-coupled capacitors to control the harmonic distortion of the amplifier.

Techniques to reduce harmonic distortions of impedance attenuators for low-power wideband high-resolution DACs

Circuits, methods, non-transitory storage media can be configured to reduce calibration errors in a signal converter. A digital-to-analog converter can include a calibration circuit configured to calibrate a digital-to-analog converter (DAC) bit element using a residual error from a previously calibrated digital-to-analog converter (DAC) bit element. The residual error can be stored in memory.

Calibration systems and methods for digital-to-analog converter

Techniques for generating precise non-overlap time and clock phase delay time across a desired frequency range are provided. A non-overlapping clock generation circuit comprises a delay lock loop (DLL) circuit that generates a control voltage to a clock generator circuit coupled thereto. The control voltage operates to maintain precise timing relationship of non-overlapping delayed clock signals generated by the clock generator circuit. In one aspect, the DLL circuit receives an input clock with a known duty cycle and derives an output control voltage to fix the unit delay to a certain portion of the input clock cycle. The clock generator circuit may also include voltage-controlled delay cells that generate sets of clock signals delayed from one another by a non-overlapping time (t).

Non-overlapping clock generation

Techniques for generating precise non-overlap time and clock phase delay time across a desired frequency range are provided. In one configuration, a device includes a non-overlapping clock generation circuit which comprises a delay lock loop (DLL) circuit that in turn generates a control voltage to a clock generator circuit coupled thereto. The control voltage operates to maintain precise timing relationship of non-overlapping delayed clock signals generated by the clock generator circuit. In one aspect, the DLL circuit receives an input clock with a known duty cycle and derives an output control voltage to fix the unit delay to a certain portion of the input clock cycle. In a further aspect, the clock generator circuit includes a plurality of voltage-controlled delay cells coupled to the DLL circuit to generate a first set of clock signals and a second set of clock signals delayed from the first set of clock signals by a non-overlapping time (t) that is independent of manufacturing process variations.

Techniques for non-overlapping clock generation

A circuit for digital-to-analog conversion is described. The circuit includes a digital-to-analog converter (DAC). The DAC includes a double cascaded current source and a differential current-mode switch (DCMS). The circuit further includes a direct current (DC) offset stage. The circuit also includes a load attenuator. The double cascaded current source may be between the DCMS and a rail voltage.

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San Diego, CA, United States of America

Tongyu Song