Seagate Technology Incorporated

Tong Shirh Stone

Mark A Gaertner

Navneeth Kankani

Rodney Virgil Bowman

Ryan James Goss

David Scott Seekins

Tim Rausch

Laszlo Hars

Jonathan Williams Haines

Monty Aaron Forehand

Richard P Michel

Brett Alan Cook

Donald Preston Matthews, Jr

Ray V Rigles

Methods for determining a variable data frequency for recording data on a zone of a magnetic storage disc, each zone including a plurality of tracks and each track including a plurality of sectors, the method includes measuring a signal to noise ratio (S/N) around at least a first track in a first zone; and modulating a data frequency based on the measured S/N around the first track.

Methods of modulating data frequency

A heat-assisted magnetic recording head is configured to write data to and read data from a magnetic recording medium. The head comprises a reader and a writer including a near-field transducer (NFT). The reader comprises a center which is laterally offset relative to a center of the writer to define a reader-writer offset (RWO) therebetween. A controller is configured to control the writer to write data to data tracks of the medium, detect a shift in the RWO, and in response to the detected shift in the RWO, control the writer to write data to a plurality of tracks defining a reserved band during an open period of the reserved band.

System and method for detecting shifting of reader-writer offset in a heat-assisted magnetic recording head

A first data set is written to first memory units identified as having a higher data reliability and a second data set is written to second memory units identified as having a lower data reliability than the first memory units. In some cases, the second data set may include metadata or redundancy information that is useful to aid in reading and/or decoding the first data set. The act of writing the second data set increases the data reliability of the first data set. The second data set may be a null pattern, such as all erased bits.

Methods and devices to increase memory device data reliability

The disclosure is related systems and methods for using operation durations of a data storage medium to generate random numbers. In one embodiment, a device may comprise a random number generator circuit configured to store a value representing a duration of an operation on the data storage medium, and generate a random number based on the value. Another embodiment may be a method comprising recording durations of access operations to a data storage medium, and generating a random number based on the durations.

Using memory access times for random number generation

A method includes programming a non-volatile memory. The memory includes a plurality of cells, wherein each cell is configured to store a plurality of values, wherein each of value is represented by N digits where N is an integer greater than 1, wherein each of the plurality of cells is further configured to store electric charge representing a plurality of voltage levels, and wherein each of the plurality of voltage levels represents one of the plurality of values. Programming comprises providing the plurality of voltage levels into a first group of voltage levels and a second group of voltage levels in one of the plurality of cells, wherein a highest voltage level of the first group is less than or substantially equal to a lowest voltage level of the second group, and storing, in the first group of voltage levels, electric charge representing a value comprising, at most, N-1 digits.

Low-wear writing in a solid state memory device

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Eden Prairie, MN, United States of America

Tong Shirh Stone