International Business Machines Corporation

Cmo Japan, Co., Ltd.

Tomoyuki Taguchi

Yoshinori Mekata

Yoshitami Sakaguchi

Manabu Kodate

Hiroki Nishiyama

Kenichi Imura

Daiju Nakanao

Atsuto Ohta

Shunichi Komatsu

Tsukasa Iwami

A method and a device for testing an array substrate for a liquid crystal display that allow time for testing to be reduced are provided. An array substrate is divided into two test blocks, and two scanning signal lines in total, one from each of the test blocks, are selected and tested at a time, so that the addresses of possible defective pixels are specified. Then, the array substrate is divided into three test blocks, and three scanning signal lines in total, one from each of the test blocks, are selected and re-tested at a time, so that the addresses of possible defective pixels are specified. Then, the address of a pixel common between the first testing and re-testing is specified as a defective address.

Method and device for testing array substrate

Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.

Inspection device for inspecting TFT

The present invention provides an inspection method of an array board and an inspection equipment thereof, which can detect a disconnection failure of a gate line even if electric potentials are applied from both ends of the gate line.

Inspection method of array board and inspection equipment thereof

A circuit inspection method includes supplying electric charges to a first, second, and third electric charge holding electrodes in an electric circuit; outputting the electric charges held in the first electric charge holding electrode after a predetermined period of time from supplying of the electric charges; changing voltages of the first and second scan lines to a drive voltage to output the electric charges held in the second electric charge holding electrode; and determining whether an electric charge writing function and an electric charge holding function of the second electric charge holding electrode are good or not based on a quantity of the supplied electric charges and a quantity of the electric charges output from the second electric charge holding electrode.

Circuit inspection method, method of manufacturing liquid-crystal display, and circuit inspection apparatus

To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data lineto turn on a switching transistorfor a prescribed time, a holding capacitorand a parasitic capacitorare charged. By turning on again the switching transistorafter a lapse of a prescribed time from turning-off of the switching transistorand by connecting the data lineto an integrator, the holding capacitorand the parasitic capacitorare discharged, and a discharged amount of charge is detected by the integrator. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.

Inspection method and apparatus for EL array substrate

Disclosed are an inspection method for a disconnection of a storage capacitor line and an inspection device for the same in an inspection of an array substrate used in a liquid crystal display apparatus. An inspection method for an array substrate is constituted, in which a quantity of charges stored in the storage capacitor becomes C (Vd &minus;Vcs ) by supplying simultaneously a pulse signal Vd and a pulse signal Vcs to the storage capacitor from a signal line and a Cs line on a TFT array substrate, and an influence of the disconnection of the Cs line is taken into consideration when the above-described quantity of charges is detected in a reading circuit. Note that the above-described inspection is performed not for all the storage capacitors, but for one storage capacitor in each Cs line. Thus, the inspection for all the Cs lines in liquid crystal panels from 14 inch diagonal to 18 inch diagonal is terminated in about 1 to 2 seconds.

Growing community of inventors

Kusatsu, Japan

Tomoyuki Taguchi