Adv Antest Corporation

Tomoyuki Itakura

Shuichi Inage

Kazuhiro Iezumi

Yoshihiro Kato

Yuki Watanabe

Yoshiyuki Aoki

Naoya Kimura

Yuichiro Harada

Keisuke Kusunoki

Koji Miyauchi

Kazuhiro Tsujikawa

A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.

Test apparatus and test method

A test system tests a DUT configured as a wireless device. A golden device is configured to provide bidirectional communication between it and the DUT. A measurement device acquires a first signal Sincluding at least an output Sof the DUT. An interface unit monitors a second signal Sincluding at least one of the output Sof the golden device and the output Sof the DUT. In response to the occurrence of a predetermined waveform pattern in the second signal, the interface unit generates a trigger signal TRIG for instructing the measurement device to acquire a signal.

Test system

Growing community of inventors

Tokyo, Japan

Tomoyuki Itakura