Sumitomo Chemical Company, Limited

Tomoya Kashiki

Eiji Yoshikawa

Hidekazu Yoshida

Sho Kanesaka

Hiroki Terai

Takayuki Okachi

Keiichi Kitamura

Yuta Ishino

Shohei Matsushita

The present invention provides an organic photoelectric conversion material such that an increase in the solution viscosity can be suppressed even after long-term storage. This organic photoelectric conversion material comprises Pd, wherein the average number of Pd clusters in a scanning transmission electron microscopic image of a thin film made of the organic photoelectric conversion material is 1500 counts/μmor less. It is preferable that the Pd clusters each have a particle diameter of from 1 nm to 20 nm. It is preferable that the organic photoelectric conversion material is a polymer for organic photoelectric conversion material; and it is more preferable that the polymer for organic photoelectric conversion material is a D-A type π-conjugated polymer. It is preferable that the polymer for organic photoelectric conversion material has a thiophene ring.

Organic photoelectric conversion material

A polymer compound comprising a structural unit represented by the formula (1):  

Polymer compound and organic semiconductor device using the same

A film comprising a polymer compound and a low molecular weight compound having carrier transportability, wherein the content of the low molecular weight compound is 5 to 40 parts by mass with respect to 100 parts by mass of the sum of the polymer compound and the low molecular weight compound, the diffraction intensity A specified by the following measuring method A is 3 to 50, and the intensity ratio (A/B) of the diffraction intensity A specified by the following measuring method A to the diffraction intensity B specified by the following measuring method B is 30 or less: (Measuring method A) the diffraction intensity A is the maximum diffraction intensity in a range of scattering vector of 1 nmto 5 nmin a profile obtained by an Out-of plane measuring method using a film X-ray diffraction method; (Measuring method B) the diffraction intensity B is the maximum diffraction intensity in a range of scattering vector of 10 nmto 21 nmin a profile obtained by an In-plane measuring method using a film X-ray diffraction method.

Film and organic semiconductor device containing the film

A polymer compound comprising a structural unit represented by the formula (1): wherein Ring A and Ring B represent each independently a heterocyclic ring, and the heterocyclic ring may have a substituent, Ring C represents an aromatic hydrocarbon ring obtained by condensing two or more benzene rings, the aromatic hydrocarbon ring has at least one of an alkyl group, an alkoxy group, an alkylthio group, an amino group or a hydroxyl group, and these groups may have a substituent, Zand Zrepresent each independently a group represented by the formula (Z-1), a group represented by the formula (Z-2), a group represented by the formula (Z-3), a group represented by the formula (Z-4) or a group represented by the formula (Z-5), wherein R represents an alkyl group, an alkoxy group, an alkylthio group, an aryl group or a mono-valent heterocyclic group, and these groups may have a substituent, and when there exist a plurality of R, these may be the same or different.

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Tsukuba, Japan

Tomoya Kashiki