Panasonic Intellectual Property Management Co., Ltd.

Matsushita Electric Industrial Co., Ltd.

Panasonic Corporation

Tomotaka Furuta

Yasuhiro Kabetani

Seiji Hamano

Kazumasa Takata

Yohei Takechi

Takashi Urashima

Hirotoshi Oikaze

Nobuo Hara

Shohei Aoki

Hidetoshi Utsuro

Masami Ito

Fumio Sugata

Masahiro Kuwabara

Junichi Kamatani

Tatsuro Shiraishi

An optical adjustment apparatus includes a measurement-light irradiation part that has a plurality of second optical fibers and emits, with timings different from each other, a plurality of lights having a single wavelength via the second optical fibers, an optical fiber block that holds exit-side end portions of the first and second optical fibers, a light detection part that receives and detects a plurality of reflected lights via the second optical fibers, a tilt calculation part that compares, with each other, variations with time of intensities of the respective reflected lights and calculates a tilt of the optical fiber block relative to the optical substrate, and a distance calculation part that calculates an inter-end surface distance between the optical substrate and the optical fiber block, based on a variation with time of an intensity of at least one reflected light.

Optical adjustment apparatus, optical adjustment method, and optical device

In an inner layer measurement method, first irradiation light and second irradiation light having a peak wavelength longer than that of the first irradiation light are formed by changing at least one of a position where light emitted from a lamp is transmitted through a short pass filter and a position where light emitted from a lamp is transmitted through a long pass filter. Then, a first XY sectional surface of a semitransparent body is measured by irradiating the first XY sectional surface with the first irradiation light. A second XY sectional surface positioned on a layer deeper than the first XY sectional surface is measured by irradiating the second XY sectional surface with the second irradiation light. Each of the short pass filter and the long pass filter can transmit the light and has properties of changing a cutoff wavelength according to the position where the light is transmitted.

Inner layer measurement method and inner layer measurement device

Provided is a winding apparatus that is provided with a splitter that splits radiant light from a light source unit into measurement light applied to a side face part of a first sheet and a second sheet and reference light applied to a reference surface, an interference detector that detects interference light formed by interference between the reference light reflected by the reference surface and the measurement light reflected by the side face part, a position detector that detects the position of the first sheet and the position of the second sheet on the basis of the detected interference light, and a decision processor that decides the quality of the wound body on the basis of the detected positions of the first sheet and the second sheet.

Winding device, winding method, inspection device and structure manufacturing method in which a position of stuck together first and second wound sheets are detected via interference light generated using reflected reference light from a reference surface

A protective member protects an objective lens. The protective member includes an insertion opening through which an objective lens is configured to be inserted and a main body configured to cover the inserted objective lens. The main body includes a side wall portion connected to the insertion opening and a bottom portion connected to the side wall portion as well as facing the insertion opening, and covers the inserted objective lens with the side wall portion and the bottom portion. The protective member further includes a liquid disposed inside the main body, a sealing film body for sealing the insertion opening and a window arranged in the bottom portion of the main body, through which light transmits. The protective member can simplify the work.

Protective member and method for using protective member

Winding device, winding method, inspection device and structure manufacturing method

In an optical interference measuring method according to the present invention, light emitted from a light source unit is split into measuring light and reference light, coherent light is detected that is obtained by interference of the reference light and the measuring light reflected from or scattered rearward from a measuring object, an optical-path length adjustment mechanism provided in the optical path of the reference light is driven to change the optical path length of the reference light, it is decided whether an image based on the detected coherent light is a normal image or a folded image based on the coherent light having varied with the change of the optical path length of the reference light, and the measuring object is measured from the detected coherent light based on a result of the decision about whether the image is a normal image or a folded image.

Optical interference measuring method and optical interference measuring apparatus

By diffracting light emitted from a collimator lens into lights of different orders by a transmission diffraction grating, applying the diffracted lights to a flat surface of an object, forming the light that has been reflected on the flat surface of the object and thereafter retransmitted through the transmission diffraction grating into an image in a position located apart from the optical axis of the outgoing light and measuring the angle of the object with respect to the optical axis of the collimator lens using the image location and the order of the light formed as the image, the angle in a wide range can be measured with a high resolving power.

Angle measuring device and method

An inspection method for evaluating the performance of an optical component at high precision is provided. According to the inspection method, a first light beamand a second light beamboth having different phases are generated from light which has passed through an optical component, and are interfered with each other to form an interference region. A linear line, a linear lineand linear linesare set within the interference regionso as to determine a distribution of light intensities on each of the linear lines. Then, a frequency corresponding to the maximal light intensity is determined. Further, an approximated liner line or an approximated curved line is determined from a plurality of frequencies determined for each of the linear line. Then, the aberration of the optical component is evaluated based on the coefficient of the approximated linear or curved line.

Method and apparatus for inspection of optical component

Positioned on a block is a filter for reflecting light &#x3bb;and transmitting another light &#x3bb;. First and second light guides are positioned on the block in an aligned relation to each other so that their angled ends oppose to each other. An adhesive is applied to the angled ends of the light guides for holding a filter. Light &#x3bb;is introduced in the light guides for adjusting the position of the light guides so that a predetermined amount of light is discharged from the light guide. A light receiver is positioned on the block through the adhesive and then light is introduced in the light guide for adjusting the position of the light receiver relative so that a predetermined amount of light is received by the light receiver. In particular, the adhesive has the same refractive index as the light guides.

Growing community of inventors

Osaka, Japan

Tomotaka Furuta