Renesas Technology Corp.

Tomoru Sato

Fujio Ito

Takafumi Kikuchi

Noriaki Sakamoto

Takehisa Yokohama

Takayuki Noto

Hiroyuki Yamauchi

A semiconductor integrated circuit includes an input circuit for taking in signals and an output circuit for outputting signals. The input circuit is so set that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition. The output circuit is so set that the driving force during the second half of signal transition is lower than the driving force during the first half of transition. Such setting that the input impedance during input signal transition is lower than the input impedance on other occasions than input signal transition reduces reflected waves during input signal transition. Such setting that the driving force during the second half of signal transition is lower than the driving force during the first half of transition suppresses production of reflected waves during the second half of signal transition. Thus, the necessity for external components, such as damping resistors and terminator resistors, for impedance matching is obviated.

Semiconductor integrated circuit

To provide a test technology capable of reducing a package size by reducing a number of terminals (pins) in a semiconductor integrated circuit of SIP or the like constituted by mounting a plurality of semiconductor chips to a single package, in SIPconstituted by mounting a plurality of semiconductor chips to a signal package of ASICSDRAMand the like, a circuit of testing SDRAM(SDRAMBIST) is provided at inside of ASICand SDRAMis tested from outside of SDRAMthat is, from ASICBy providing the test circuit of SDRAMat inside of ASICit is not necessary to extrude a terminal for testing SDRAMto outside of SIP

Growing community of inventors

Fuchu, Japan

Tomoru Sato