Adv Antest Corporation

Tomoo Yamanouchi

Makoto Nakanishi

Taku Sato

Eiji Kanoh

Masahiko Takikawa

Junichi Okayasu

Kensuke Okumura

Daiju Terasawa

Tatsuru Orikasa

Provided is a semiconductor device, including: a compound semiconductor layer; a first insulating film provided on the compound semiconductor layer; a second insulating film, which is formed of a material different from the first insulating film, provided on the first insulating film; and a gate electrode provided above the second insulating film. The first insulating film may include tantalum oxynitride, and the second insulating film may include a material with a larger band gap than tantalum oxynitride. The second insulating film may include aluminum oxynitride.

Semiconductor device, manufacturing method of semiconductor device and testing device

It is an objective to provide a semiconductor device with low leak current. The semiconductor device includes a plurality of ground side electrodes and a plurality of signal side electrodes arranged on a semiconductor substrate in an alternating manner; a plurality of control electrodes arranged respectively between each pair of a ground side electrode and a signal side electrode; a ground side electrode connecting section that connects the ground side electrodes to each other; a signal side electrode connecting section that connects the signal side electrodes to each other; and ground side lead wiring and signal side lead wiring that extend respectively from a region near one end and a region near another end of an arranged electrode section, in which the ground side electrodes and the signal side electrodes are arranged in an arrangement direction, away from the arranged electrode group in the arrangement direction.

Semiconductor device, method for manufacturing of semiconductor device, and switching circuit

Provided is a spectrum analysis system that measures a signal component at each frequency of an input signal, comprising a sampling section that samples the input signal at prescribed bandwidths to digitize the input signal, and outputs a resulting digital output signal; a converting section that converts the digital output signal from the sampling section into the signal component at each frequency of a unit bandwidth; and an output section that (i) outputs the digital output signal output by the sampling section when a frequency span, which is a frequency range in which the measurement result of the signal component at each frequency of the input signal is output, is greater than or equal to a predetermined reference bandwidth and (ii) outputs the signal component at each frequency converted by the converting section when the frequency span is less than the predetermined reference bandwidth.

Spectrum analyzer system and spectrum analyze method

Growing community of inventors

Miyagi, Japan

Tomoo Yamanouchi