Sysmex Corporation

Tomonori Okazaki

Noriyuki Nakanishi

Mitsuo Yamasaki

Takahiro Saino

Takaaki Nagai

Daigo Fukuma

Syunsuke Yao

A sample measurement apparatus according to one or more embodiments includes a processing unit that aspirates a sample inside a sample container and measures the sample; a transfer unit that includes a holder to hold the sample container, and that picks up the sample container from a rack capable of storing the sample containers at storage positions on a row and transfers the sample container to the processing unit; and a detection unit that is attached to the holder and is movable integrally with the holder, and that detects whether or not there is the sample container at each of the storage positions.

Sample measurement apparatus and method of measuring samples

First and second racks each has fixed positions to hold sample tubes. First and second drawers slide into and out of the case, and that support the first and second racks, respectively. A tube set unit is provided in an area close to the first rack in the case. A tube transfer unit removes sample tubes from the first and second racks in the case and a controller that controls a transfer operation of the tube transfer unit. The first rack is supported by the first drawer such that the first rack leaves a transit location in the case behind the first drawer in the direction of the first drawer movement into the case. The controller controls the tube transfer unit to remove at least one sample tube from the second rack and transfers the tube to the tube set unit via a path traversing the transit location.

Sample processing apparatus and rack

Growing community of inventors

Kobe, Japan

Tomonori Okazaki