Ricoh Company, Ltd.

Tomoki Satoi

Naohiko Nishigaki

A semiconductor integrated circuit including a user logic circuit is disclosed in which circuit parts for shifting data are composed of registers other than scan cells except for the circuit part right after a combinational circuit, and the parts configured of the registers other than the scan cells are used as a scan path.

Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing method

A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.

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Kanagawa, Japan

Tomoki Satoi