Shimadzu Corporation

Tomoki Sasayama

Kazumi Yokota

Ryuta Shibutani

Tomoyo Tao

Atsuhiko Otaguro

Fumiya Katsutani

Takeshi Maji

Atsuhiro Iida

Hisato Fukuda

Toshiro Kimura

Daijiro Kato

Eiji Ikeda

A microscopic Raman spectroscopy device includes laser oscillators (excitation light sources) that emit excitation laser lights (excitation lights) of different wavelengths, a spectrometer that uses a diffraction grating to disperse Raman scattering light emitted from a sample by irradiation with the excitation laser light from the laser oscillator, and a CCD detector that detects and photoelectrically converts the Raman scattering light dispersed by the spectrometer. The spectrometer includes incident apertures, a plurality of (two) optical systems that guide the Raman scattering light incident from the incident aperture to the diffraction grating, and a plurality of light beams dispersed by the diffraction grating are incident on one imaging lens in tandem.

Microscopic raman spectroscopy device

An infrared Raman device is capable of switching and performing Raman measurement and first infrared measurement on a sample. The infrared Raman device includes an objective lens for Raman measurement; a first observation lens for infrared measurement; a laser light source that generates laser light; a first infrared light source that generates first infrared light; and a mirror. The mirror is disposed at time of the Raman measurement to reflect the laser light to cause the laser light to pass through the objective lens for Raman measurement and reflect Raman light generated from the sample by the laser light that passes through the objective lens for Raman measurement and radiated to the sample. The Raman light passes back through the objective lens for Raman measurement.

Infrared Raman device

A Raman infrared compound microscope device includes: a first light source that generates laser light; a second light source that generates infrared light; a third light source that generates visible light; and a first optical system. The first optical system orients the visible light having reached the first optical system in different directions between when performing a Raman analysis using Raman light generated from a sample by irradiation of the laser light and when performing a first infrared analysis using the infrared light having passed through the sample.

Raman infrared compound microscope device

An optical measuring device including a sample placement portion for a measurement sample to be placed therein; a light source portion for emitting a measurement beam toward the measurement sample that is placed in the sample placement portion; and a detector for detecting sample information from a measurement sample that is disposed in the sample placement portion; a cover portion that is able to open and close, for accessing the interior of the sample placement portion, is formed on the sample placement portion; an optical element member for not transmitting light of at least a prescribed wavelength band within the measurement beam; and a driving mechanism that is linked mechanically with the opening and closing of the cover portion to move the optical element member.

Optical measuring device and safety device used therein

A microscope is provided. The microscope includes: a detection section for detecting the measurement light; a first image acquisition section emitting the visible light onto a detection surface to obtain an optical image; and a switch mirror or beam splitter disposed on a light path, along which the measurement light from the analysis position of the sample is guided to the detection section. The microscope further includes a second image acquisition section that is disposed in a position apart from the light path of the detection section for obtaining an optical image of a large area which includes the analysis position of the sample, wherein the optical image of the large area is larger than an optical image of an area, which includes the analysis position of the sample, obtained by the first image acquisition section.

Microscope

A spectrophotometer has a specimen cell; a light source unit for emitting light to the specimen cell; a photodetector for detecting the light that passed through the specimen cell; a light-shielding unit for blocking the light from impinging on the photodetector at predetermined periods; a memory unit for storing output strength signals detected by the photodetector; and a controller for calculating transmittance or absorbance based on output strength signal S of the incidence duration and output strength signal DS of the light-blocked duration stored in the memory unit. The incidence duration and light-blocked duration occur in this sequence in a single period. The controller calculates the true output strength signal sof the Nperiod removed of the effects of output strength signal Sof the incidence duration of the (N&#x2212;1)period that are included in the output strength signal Sof the incidence duration of the Nperiod.

Spectrophotometer

A photometric apparatus which includes a cover that houses a UV light source and a photodetector, the cover hermetically sealing an entire light path extending from the light source to the photodetector therewithin; device for replacing an internal atmosphere of the cover with nitrogen gas; and a window plate unit which is adapted to be readily attached to and detached from a partition wall between a light source chamber and a spectral chamber located in a subsequent stage thereof. The window plate unit blocks gaseous communication between the light source chamber and the spectral chamber while allowing measurement light to be transmitted therethrough.

Photometric apparatus

In a spectrophotometer, the following formula is stored in advance as a correction formula of a rotation angle in a correction formula storing portion; &#x3b8;'=&#x3b8;+A&#x2022;sin (C&#x2022;&#x3b8;+&#x3b8;a)+B&#x2022;sin (C&#x2022;&#x3b8;+&#x3b8;b)+&#x3b8;c, wherein C, Crepresent coefficients theoretically determined in advance by a structure of a reduction mechanism, and A, B, &#x3b8;a, &#x3b8;b, &#x3b8;c are coefficients specific to the reduction device which are calculated based on measurement results of a plurality of bright line spectrums through fittings by a coefficient determining portion. In case a sample is measured actually, when a desired wavelength is set, a rotation angle correcting portion corrects a rotation angle &#x3b8; corresponding to the desired wavelength to calculate &#x3b8;&#x2032; by applying the above-stated correction formula, and then, controls a motor so that a diffraction grid is rotated by the angle &#x3b8;&#x2032;.

A zoom lens is provided between the sample and the slit of a spectrophotometer to change the size of the image of the sample on the slit plane. The picture of the sample is taken by the zoom lens and is shown on a display screen, on which a window is superimposed. When the operator changes the location of the window, the sample is moved accordingly, and when the operator changes the size of the window, the focal length of the zoom lens is changed, whereby the size of the measurement area is changed. By changing the size of the measurement area on the slit plane while the size of the elementary photo-sensors of a photo-detector is unchanged, the resolution of the two-dimensional spectrophotometry can be changed.

Growing community of inventors

Kyoto, Japan

Tomoki Sasayama