Hitachi, Ltd.

Hitachi High-tech Corporation

Tomokazu Shimakura

Hiroshi Suzuki

Yoshio Takahashi

Masaki Hasegawa

Chihiro Nakashima

Takeshi Fujita

Akira Sugawara

Hideo Kashima

Taizo Honda

Kimio Nakamura

Kazuo Tomida

Satoshi Totake

Tatsuya Fujisawa

A radiation therapy apparatus that enhances the reliability and ease of use of a treatment is provided. A radiation therapy apparatus includes: a treatment bed moving a top plate with an object to be treated placed on the top plate to a predetermined treatment location; an imaging apparatus moving to the predetermined treatment location from a direction different from the direction of movement of the top plate and picking up an image of the object to be treated; and an irradiation apparatus provided between the treatment bed and the imaging apparatus, extensible, and applying a radioactive ray to the object to be treated. When the CT apparatus moves to the treatment location, the irradiation apparatus moves to a predetermined waiting position. When applying a radioactive ray to an object to be treated, the irradiation apparatus moves to a predetermined irradiation position.

Radiation therapy apparatus and control method of radiation therapy apparatus

To provide a particle beam therapy device that expands an irradiation field while avoiding an increase in size of a scanning unit or an irradiation device including the scanning unit. A shift unitis provided downstream of a scanning unit. The shift unitdeflects a carbon beam as a particle beam to shift the irradiation field, thereby forming an expanded irradiation field. The shift unitincludes a first shift electromagnetthat shifts the irradiation field in a Y direction and a second shift electromagnetthat shifts the irradiation field in an X direction. The scanning unit is dynamically controlled, and the shift unitis statically controlled.

Particle beam therapy device and irradiation field forming method

An object of the present invention is to provide a sample holder that can carry out a series of observations in which a rotational series image at arbitrary angles, namely, from &#x2212;180&#xb0; to +180&#xb0; around the x-axis of an observation region and a rotational series image at arbitrary angles, namely, from &#x2212;180&#xb0; to +180&#xb0; around the y-axis are obtained without taking a sample out of a sample chamber. A sample holder includes a power unit, a power separator, a rotational movement transmission mechanism, and a linear movement transmission mechanism. The power separator separates one movement of the power unit to be distributed to the rotational movement transmission mechanism and the linear movement transmission mechanism. The rotational movement transmission mechanism provides a rotational movement around a second rotational axis. The linear movement transmission mechanism provides a linear movement around the second rotational axis.

Sample holder, charged particle beam apparatus, and observation method

The disclosed invention provides a sample holder capable of reducing or preventing the influence of a charged particle beam deflected by applying a magnetic field to a sample and provided with means for simply switching between a mode of observing a sample while applying a magnetic field to the sample, and a mode free of a magnetic field in which a magnetic field becomes zero completely. The sample holder includes a magnetic field generating element including three or more magnetic gaps for applying a magnetic field to a sample, a cantilever-beam-shaped sample holding element that holds a sample on one end thereof, and a moving mechanism that adjusts a relative position between a sample and a magnetic gap. The magnetic gaps can be placed along an optical axis of a charged particle beam.

Charged particle beam apparatus sample holder with magnetic field generating element and sample holding element

The charged particle beam device has an unlimitedly rotatable sample stage and an electric field control electrode for correcting electric field distortion at a sample peripheral part. A voltage is applied to a sample on the unlimitedly rotatable sample stage through a retarding electrode that is in contact with a holder receiver at a rotation center of a rotary stage. An equipotential plane on the electric field control electrode is varied by applying a voltage to the electric field control electrode, and following this the equipotential plane at a sample edge is corrected, which enables the sample to be observed as far as its edge.

Charged particle beam device

A charged particle beam device has a tilt detection unit that detects a tilt of a sample surface and an E&#xd7;B deflector in which an electric field and a magnetic field are overlapped with each other and which causes, according to the detected tilt of the sample surface, the sample surface to be perpendicularly irradiated with an irradiation charged particle beam while, at the same time, aligning the trajectory of the charged particle beam with the optical axis centers of an irradiation optical system and an imaging optical system; thereby, the charged particle beam device can prevent problems possibly occurring in cases where a sample stage is tilted or a sample surface is undulating and can enable an accurate image to be acquired.

The magnetic field intensity distribution of a magnetic material sample, such as a magnetoresistive device, is measured with a probe having a tip portion of a magnetic material to which current is made to flow from a power source to the magnetic material. The probe is scanned relative to the surface of the magnetic material sample in two modes. In a first mode, the probe is scanned by being oscillated in a vertical direction to tap a surface of the sample to be tested. In a second mode, the probe is scanned while being held in contact with the measured surface. Corresponding first and second output signals from the two modes of scanning are processed to calculate the magnetic field intensity distribution of the sample magnetic material.

Evaluation system and method of measuring a quantitative magnetic field of a magnetic material

A method and instrument for measuring, with a high spatial resolution, a magnetic or electric field that varies repeatedly at high speed. An electron beam is deflected by passage through a magnetic or electric field to be measured and is allowed to pass through a deflection electrode to thereby be deflected in a direction perpendicular to the magnetic or electric field to be measured. A track of the deflected electron beam is detected by a two-dimensional sensor, and a waveform or pattern is displayed wherein a time base and an axis of the magnetic field to be measured are orthogonal to each other.

Growing community of inventors

Tokyo, Japan

Tomokazu Shimakura