Ngk Spark Plug Company, Limited

Tomohide Yamada

Motohiko Sato

Akifumi Tosa

Kazuhiro Hayashi

Kenji Murakami

Motonobu Kurahashi

Hiroyuki Takahashi

Shigeru Taga

Tatsuya Kato

Chie Honda

An electrical testing substrate unit includes a multi-layer ceramic substrate formed of mullite and a borosilicate glass as predominant ceramic components. In the multi-layer ceramic substrate, the borosilicate glass contains an alkali metal oxide in an amount of 0.5 to 1.5 mass %. The multi-layer ceramic substrate has a mean coefficient of linear thermal expansion having a value of 3.0 to 4.0 ppm/&#xb0; C. between &#x2212;50&#xb0; C. and 150&#xb0; C. A thermal expansion coefficient, &#x3b1;1, of the multi-layer ceramic substrate as determined at a particular temperature and a thermal expansion coefficient, &#x3b1;2, of a to-be-tested silicon wafer as determined at the same temperature silicon satisfy a relation: 0 ppm/&#xb0; C.&#x3c;&#x3b1;1&#x2212;&#x3b1;2&#x2266;2.5 ppm/&#xb0; C. through the temperature range of &#x2212;50&#xb0; C. to 150&#xb0; C. Electrodes are formed on a surface of the multi-layer ceramic substrate.

Electrical inspection substrate unit and manufacturing method therefore

A capacitor comprising: a plurality of laminated dielectric layers; a plurality of inner electrode layers each disposed between mutually adjacent ones of the dielectric layers; and dummy electrode layers respectively disposed between the dielectric layers, disposed on sides closer to outer peripheral sides of the dielectric layers than to the inner electrode layers and disposed apart from the inner electrode layers.

Method of manufacturing capacitor for incorporation in wiring board, capacitor for incorporation in wiring board, and wiring board

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Komaki, Japan

Tomohide Yamada