Hitachi, Ltd.

Tomoaki Sakata

Toshihiko Nakata

Kenji Yasuda

Yoshitada Oshida

Satoshi Takahashi

Keisuke Yamaoka

Hiroshi Kato

Shizuo Yamazaki

Tsutomu Kuse

Mikio Rachi

Koichi Sugimoto

Takamichi Suzuki

Michinaga Kohno

A DNA inspecting apparatus including driving means for relatively changing positions of the multi-spot lights and a position of the DNA chip so as to detect the fluorescent lights in such a manner that a desired area on the DNA chip is irradiated with the multi-spot lights, and a control system for determining and inspecting DNA information about the to-be-inspected DNA chip from fluorescent light intensities and fluorescent light positions of the desired area on the DNA chip, the fluorescent light intensities and the fluorescent light positions being detected by the driving means and the fluorescent light detecting means.

Method of inspecting a DNA chip and apparatus thereof

A method of inspecting a DNA chip and an apparatus therefor that allow a picture to be reconstructed in the following steps: A plurality of irradiation spots are formed on a DNA probe array mounted on a stage. Then, the stage is displaced in X, Y directions so as to execute a scanning, thereby irradiating substantially all the entire surface of the DNA probe array. Next, a plurality of emitted fluorescent lights, which are generated from the plurality of irradiation spot portions on the DNA probe array, are converged and are then detected simultaneously by multi detectors. Finally, a data processing apparatus processes the detected signals, thereby reconstructing the picture.

Method of inspecting a DNA chip

An automatic assembling system for assembling a product constituted by a plurality of parts, includes a group cell having a plurality of assembling cells and inspecting cells, pallets loaded with the same type of parts or products, at least one buffer for holding a plurality of pallets, and at least one pallet hand-over mechanism for transferring pallets between the buffer and each cell. At least one of the buffers is provided in common for a plurality of cells, and at least one of the pallet hand-over mechanisms is provided to the common buffer.

Automatic assembling system

An apparatus for fetching a component part, with the apparatus including a finger unit pivotally supporting a plurality of fingers adapted to catch a component part. A first detection unit detects a catch of a component part and a first drive opens or closes the fingers. A holding unit swingably supports the finger unit and has a slider which is slidable in a horizontal direction by a drawback force. A second detection unit detects the slider at an end of the sliding motion. A moving unit supports the holding unit and moves the holding unit at least in the vertical direction by a second drive. A drive control is provided for controlling the first and second drives in accordance with signals produced by the first and second detection units so as to enable a catching of the component part.

Apparatus for fetching component parts

A parts feeding and assembling system including a plurality of stockers containing a multiplicity of parts arranged in a disorderly manner, a separating and feeding mechanism for separating one part after another from the parts in the stockers and feeding same to a predetermined station, a tentatively positioning mechanism for tentatively positioning each part fed to the station by the separating and feeding mechanism, a parts posture discriminating mechanism for discriminating the posture of each part including the position and direction tentatively positioned by the tentatively positioning mechanism, a parts posture changing mechanism for changing the posture of each part in accordance with the result of discrimination of the part effected by the parts posture discriminating mechanism and an assembling mechanism for assembling each part in a predetermined position of an assembly of parts after the part has had its posture changed. The assembling mechanism and the parts posture changing mechanism may be formed into an assembling robot.

Growing community of inventors

Hiratsuka, Japan

Tomoaki Sakata