Anritsu Corporation

Tomoaki Kabasawa

Tatsuya Iwai

Hiroyuki Onuma

An error rate measuring apparatus that inputs a PAM4 signal of a known pattern as a test signal to a device under test W, receives a signal from the device under test W compliant with the input of the test signal, and measures whether or not an FEC operation of the device under test W is possible based on a comparison result of the received signal and the test signal includes an operation unit that sets one Codeword length and one FEC Symbol length of the FEC as a setting parameter to the signal received from the device under test W according to a communication standard of the device under test W, and a display unit that parallel-displays MSB data and LSB data of each piece of symbol string data obtained by receiving and converting the signal from the device under test W on a display screen.

Error rate measuring apparatus and data division display method

[Task] There is provided a signal generation apparatus and a signal generation method capable of performing mutual switching between a PAM N signal having n values and a PAM M signal having m values (m&#x3c;n) without generating a noise or an overvoltage. [Means for Resolution] There are provided a PAM N generation circuitthat generates a PAM N signal of n values, a PAM M generation circuitthat generates a PAM M signal of m values (m&#x3c;n) having a maximum voltage level equal to a maximum voltage level of the PAM N signal generated by the PAM N generation circuit, and a selectorthat outputs any one of the PAM N signal generated by the PAM N generation circuitand the PAM M signal generated by the PAM M generation circuit

Growing community of inventors

Kanagawa, Japan

Tomoaki Kabasawa