Mitsubishi Electric Corporation

Tomo Ikuyama

Junji Yamamoto

Daiki Ata

Satoshi Namematsu

A learning device and other techniques allow accurate diagnosis of a production facility. A learning device () includes a data acquirer that acquires data for learning, and a model generator that generates a learning model for inferring a condition of a workpiece () handled in a production facility () on the basis of the data for learning. The data for learning includes setting data indicating a setting of the production facility (), image data indicating an image of the production facility () captured by a camera (), temperature data indicating a surface temperature of the production facility () measured by a temperature sensor (), distance data indicating a distance from a range sensor () to the production facility () measured by the range sensor (), and condition data indicating the condition of the workpiece () handled in the production facility ().

Learning device, diagnostic system, and model generation method to diagnose abnormality based on temperature measurement in a production facility

A programmable controller according to an embodiment includes: a bus for data transmission and reception; a synchronous-control signal line that transmits a synchronous control signal; a synchronous-control-signal generating unit that is connected to the synchronous-control signal line and generates the synchronous control signal on a basis of an external signal; a data holding unit that is connected to the bus and the synchronous-control signal line and latches a signal from an external device in an internal memory in synchronization with the synchronous control signal; and a CPU unit that is connected to the bus and the synchronous-control signal line and reads a value in the internal memory via the bus in synchronization with the synchronous control signal.

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Tokyo, Japan

Tomo Ikuyama