Micron Technology Incorporated

Intel Corporation

Other

Texas Instruments Corporation

Round Rock Research, LLC

Intel Ndtm US LLC

Tommaso Vali

Luca De Santis

Violante Moschiano

Giovanni Santin

Frankie F Roohparvar

Kenneth James Eldredge

Michele Incarnati

Giulio Giuseppe Marotta

Umberto Siciliani

William Henry Radke

Vishal Sarin

Ramin Ghodsi

Giovanni Naso

Andrea D'Alessandro

Agostino Macerola

Mattia Cichocki

Massimo Rossini

Pranav Kalavade

Walter Di Francesco

Andrea Giovanni Xotta

Akira Goda

Theodore T Pekny

Girolamo Gallo

Maria-Luisa Gallese

Jeremy Binfet

Emilio Camerlenghi

Ali Mohammadzadeh

Alessandro Torsi

Marco-Domenico Tiburzi

Mark A Hawes

Allahyar Vahidimowlavi

William C Filipiak

Carlo Musilli

Tecla Ghilardi

Stefano Perugini

Michele Piccardi

Lance W Dover

Terry M Grunzke

Luigi Pilolli

Giuliano Gennaro Imondi

Jason Lee Nevill

Cristina Lattaro

Pietro Piersimoni

Fernanda Irrera

Federica Paolini

Guido Luciano Rizzo

Umberto Minucci

Luca DeSantis

Aaron S Yip

Richard M Fastow

Jung Sheng Hoei

June Lee

Karl David Schuh

Chang Wan Ha

Jeffrey S McNeil, Jr

Dheeraj Srinivasan

Daniel J Hubbard

Carmine Miccoli

Walter Di-Francesco

Luca Nubile

Andrea Smaniotto

Jeffrey Scott McNeil, Jr

Maria Luisa Gallese

Stefano Menichelli

Rohitkumar Makhija

Enrico Favaro

Claudia Ciaschi

Angelo Covello

Violante Moshciano

Ricardo Cardinali

Violente Moschiano

Ercole Di Lorio

A memory device includes a memory array comprising a plurality of wordlines, and control logic, operatively coupled with the memory array. The control logic causes a measurement programming pulse to be sequentially applied to each of the plurality of wordlines of the memory array and determines respective threshold voltages stored in a number of memory cells associated with each of the plurality of wordlines. The control logic further determines a difference in the respective threshold voltages based on a location of the number of memory cells within each wordline and determines a respective resistance-capacitance (RC) time constant for each of the plurality of wordlines in view of the difference in the respective threshold voltages.

Tracking RC time constant by wordline in memory devices

In some implementations, a memory device may resolve a set of latches of a NAND page buffer to a set of initialized values. The memory device may obtain a NAND page buffer initialized data set from the set of initialized values of the set of latches. The memory device may generate a security key using the NAND page buffer initialized data set.

NAND page buffer based security operations

Control logic in a memory device receives, from a requestor, a request to read data from the memory array, the request comprising an indication of a segment of the memory array where the data is stored and performs, using previously configured read operation parameters, a first read operation to read the data and a write temperature associated with the data from the memory array. The control logic determines whether the previously configured read operation parameters satisfy a temperature criterion and responsive to determining that the previously configured read operation parameters do not satisfy the temperature criterion, configures the memory device with updated read operation parameters, and performs, using the updated read operation parameters, a second read operation to read the data from the memory array.

Cross-temperature compensation in a memory sub-system

Power consumption of sensing circuitry in a NAND Flash device is reduced by reducing the voltage supply to a portion of logic circuits in sensing circuitry. A first power domain provides power to a first portion of the logic circuits in the sensing circuity and a second power domain provides power to a second portion of the logic circuits in the sensing circuitry. The first power domain has a higher voltage than the second power domain.

Method and apparatus to reduce power consumption of page buffer circuitry in a non-volatile memory device

A memory device includes a memory array comprising a plurality of memory planes, wherein the plurality of memory planes are arranged in a plurality of independent plane groups, and wherein each of the plurality of independent plane groups comprises one or more of the plurality of memory planes. The memory device further includes a plurality of independent analog driver circuits coupled to the memory array, wherein a respective one of the plurality of independent analog driver circuits is associated with a respective one of the plurality of independent plane groups. The memory device further includes a common analog circuit coupled to the memory array, wherein the common analog circuit is shared by the plurality of independent analog driver circuits and the plurality of independent plane groups. The memory device further includes a plurality of control logic elements, wherein a respective one of the plurality of control logic elements is associated with a respective one of the plurality of independent analog driver circuits and a respective one of the plurality of independent plane groups.

Independent plane architecture in a memory device

In some implementations, a memory device may receive a command to read data in a first format from non-volatile memory, the data being stored in a second format in the non-volatile memory, the second format comprising a plurality of copies of the data in the first format. The memory device may compare, using an error correction circuit, the plurality of copies of the data to determine a dominant bit state for bits of the data. The memory device may store the dominant bit state for bits of the data in the non-volatile memory as error-corrected data in the first format. The memory device may cause the error-corrected data to be read from the non-volatile memory in the first format as a response to the command to read the data in the first format.

Bit error management in memory devices

Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verification at another stage of the device lifetime, reducing performance of the device. As discussed herein, verification for higher voltage level programming is delayed until verification for lower voltage level programming reaches at least a threshold level of success instead of using a hard-coded number of verify steps to skip. As a result, the performance drawbacks associated with skipping a hard-coded number of verify cycles may not occur.

Reducing program verifies for multi-level NAND cells

A memory device might include control circuitry configured to cause the memory device to compare input data to data stored in memory cells connected to a data line, cause a first level of current to flow from the data line in response to a mismatch between one digit of the input data and data stored in a respective pair of memory cells, cause a second level of current to flow from the data line in response to a mismatch between a different digit of the input data and the data stored in a respective pair of memory cells, compare a representation of a level of current in the data line to a reference, and deem the input data to potentially match or not match the data stored in the plurality of memory cells in response to the comparison.

Memory devices for comparing input data to data stored in memory cells coupled to a data line

A memory device includes a memory array configured with a plurality of memory planes, and control logic, operatively coupled with the memory array. The control logic performs a plurality of asynchronous memory access operations on the plurality of memory planes, detects an occurrence of an asynchronous interrupt event, and initiates a termination procedure for each of the plurality of asynchronous memory access operations to permit each of the plurality of asynchronous memory access operations to end at different times. In response to a first memory access operation of the plurality of asynchronous memory access operations ending, the control logic asserts a command result signal, wherein the command result signal is de-asserted automatically in response to receipt of a subsequent memory access command directed to any of the plurality of memory planes, and asserts a persistent event register signal, wherein the command result signal is de-asserted in response to receipt of a clear event register command.

Asynchronous interrupt event handling in multi-plane memory devices

A system includes a memory array, a thermometer, and control logic, operatively coupled with the memory array and the thermometer, to perform operations including causing the thermometer to obtain a first temperature result, monitoring a time since obtaining the first temperature result, determining whether the time satisfies a threshold time condition, in response to determining that the time satisfies the threshold time condition, causing the thermometer to obtain a second temperature result from an automatic temperature reading, determining a difference between the second temperature result and a previously stored temperature result, and filtering the second temperature result based on the difference to obtain a new stored temperature result.

Temperature readings for memory devices to reduce temperature compensation errors

Memory devices might include a plurality of memory cell pairs each configured to be programmed to store a digit of data; and control circuitry configured to cause the memory device to compare the stored digit of data of each memory cell pair to a received digit of data, determine whether a match condition or a no-match condition is indicated between the stored digit of data of each memory cell pair and the received digit of data, and deem a match condition to be met between the received digit of data and the stored digits of data of the plurality of memory cell pairs in response to a match condition being determined for a majority of memory cell pairs of the plurality of memory cell pairs.

Memory devices for pattern matching based on majority of cell pair match

Memory having a controller configured to cause the memory to determine a respective raw data value of a plurality of possible raw data values for each memory cell of a plurality of memory cells, count occurrences of each raw data value for a first set of memory cells of the plurality of memory cells, store a cumulative number of occurrences for each raw data value, determine a plurality of valleys of the stored cumulative number of occurrences for each raw data value with each valley corresponding to a respective raw data value of the plurality of possible raw data values, and, for each memory cell of a second set of memory cells of the plurality of memory cells, determine a data value for that memory cell in response to the raw data value for that memory cell and the respective raw data values of the plurality of valleys.

Apparatus for determining data states of memory cells

Apparatuses and methods for concurrently accessing different memory planes are disclosed herein. An example apparatus may include a controller associated with a queue configured to maintain respective information associated with each of a plurality of memory command and address pairs. The controller is configured to select a group of memory command and address pairs from the plurality of memory command and address pairs based on the information maintained by the queue. The example apparatus further includes a memory configured to receive the group of memory command and address pairs. The memory is configured to concurrently perform memory access operations associated with the group of memory command and address pairs.

Apparatuses and methods for concurrently accessing different memory planes of a memory

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Sezze, Italy

Tommaso Vali