Micron Optics, Inc.

Tom Q Li

Calvin M Miller

Kevin Hsu

Jeffrey W Miller

Yufei Bao

David Daugherty

A multi-wavelength reference for use in identifying and measuring wavelengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.

Fabry-perot fiber bragg grating multi-wavelength reference

A multi-wavelength reference for use in identifying and measuring wave-lengths of radiation from an optical device. The invention provides an interferometer to generate a comb of accurately spaced peaks spanning a selected wavelength range combined with a fiber Bragg grating (FBG) of known Bragg wavelength to generate a peak or notch of known wavelength for use in identifying or marking a peak of the comb. The combination provides an accurate multi-wavelength reference useful in particular with high resolution wavelength scanners, such as tunable FFPI. The invention further provides systems for controlling, and/or compensating for, relative shifts in the wavelengths of the interferometer and the FBG as a function of changing temperature.

Fabry Perot/fiber Bragg grating multi-wavelength reference

A reference system for an optical wavelength scanner, used for measuring wavelengths of radiation from an optical device. The system utilizes a wavelength reference comprising a fixed fiber Fabry-Perot (FFP) filter in combination with a reference fiber Bragg grating (FBG) of accurately known wavelength to minimize the effects of drift and nonlinearities in the scanner. The system utilizes dual optical branches, one containing a device or devices which generate, emit or reflect light of a particular wavelength which is to be measured or identified and the other containing the reference. The two branches are periodically illuminated, while the wavelength band is scanned for peaks or notches in light intensity in the illuminated branch. The wavelengths, at which peaks or notches in the light intensity of each branch occur, are logged. The wavelengths of the reference comb of the fixed FFP are determined by reference to that of the reference FBG. Then, the peaks or notches in the light intensity from the device under test are located by interpolation with respect to the comb of peaks produced by the reference.

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San Jose, CA, United States of America

Tom Q Li