Texas Instruments Corporation

Tom Leslie

Andrew J Pickering

Simon D Forey

Peter Hunt

Bhajan Singh

Andrew Keith Joy

Derek Colman

Robert Simpson

Vipul Raithatha

A debug circuit for a multi-mode circuit driven by a clock signal, with an input for a clock signal, and a debug signal generator arranged to generate for each of a subset of the modes of the multi-mode circuit a corresponding debug signal based on a clock signal provided at the input. The frequency of debug signals is dependent on the frequency of a clock signal provided at the input, and each debug signal selects its respective mode for a length of time longer than that of each other mode of the multi-mode circuit, or each debug signal selects its respective mode for a length of time shorter than that of each other mode of the multi-mode circuit.

Debug circuit and a method of debugging

There is provided a method for Loss of Signal Built In Self Test, and corresponding apparatus comprising: a loopback driver for receiving test signals, and for directing the test signals to at least one of a first output of the loopback driver and a second output of the loopback driver; a Digital to Analogue Converter DAC connected to the loopback driver for controlling the amplitude of the data input signals transmitted by the loopback driver; and coupling means for directing the scaled signals to a Loss of Signal detector. Also provided is a method for testing the hysteresis thresholds of an ACJTAG module, and corresponding apparatus comprising a loopback driver for receiving data test signals, and for directing the test signals to at least one of a first output of the loopback driver and a second output of the loopback driver; a Digital to Analogue Converter DAC connected to the loopback driver for controlling the amplitude of the data input signals transmitted by the loopback driver; and coupling means for directing the scaled signals to the ACJTAG block.

Built in self test

There is provided a power supply monitor circuit comprising a positive supply monitoring input, a negative supply monitoring input, and a voltage divider connected between the positive and negative supply monitoring inputs and having an intermediate node providing a potential intermediate those on the positive and negative supply monitoring inputs. A sampling circuit is connected to sample the potential at each of the positive supply input the negative supply input and the intermediate node. Also provided is a method of monitoring noise on a power supply whereby phase information from those samples is derived about the noise signals at the two said points.

Power supply monitor

There is provided a method and apparatus for performing an eye scan. Said apparatus comprises: a receiver for receiving input signals; an equaliser for processing said input signals; a data sampler for sampling said processed input signals at certain sampling points to produce a data output, said data sampler being controlled by a clock signal; an edge sampler for detecting the edges of the processed input signal; an early/late voter for deciding whether a current sampling point needs to be advanced or retarded. The early/late voter passes an Up/Down signal to an interpolator for maintaining said clock signal, said interpolator acting on said Up/Down signal to adjust the clock signal by stepping it forward or backward according to control need, so that said sampling point can be advanced or retarded.

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Northampton, United Kingdom

Tom Leslie