Kabushiki Kaisha Toshiba

Tokio Tanaka

Toshiyuki Furusawa

Noriyuki Moriyasu

Eiji Sawada

Satoko Kawakami

Hitoshi Nemoto

Nariyuki Fukuda

Isao Ooigawa

Hiroyuki Fujioka

According to one embodiment, a semiconductor integrated circuit includes a semiconductor integrated circuit a voltage regulator providing a prescribed power-supply voltage, a plurality of delay test circuits, each of the delay test circuits being configured in each of areas where electrical current flows in response to each of operation modes, a test control unit executing a delay test using the delay test circuit under a test mode while decreasing a power-supply voltage in a stepwise fashion, a supply voltage decision unit deciding the power-supply voltage of the operation mode on a basis of the delay test, a memory unit storing the power-supply voltage of each operation mode, a supply voltage configuration unit reading out the power-supply voltage corresponding to the operation mode from the memory unit, and the supply configuration unit arranging the power-supply voltage as an output voltage of the voltage regulator when each of the operation modes starts to execute.

Semiconductor integrated circuit deciding a power-supply voltage based on a delay test

Growing community of inventors

Kanagawa-ken, Japan

Tokio Tanaka