Omron Corporation

Tokiko Inoue

Yusuke Iida

Hitoshi Oba

Tatsuya Matsunaga

An image taken by an imaging device is displayed on a display unit. When a confirmation instruction is inputted through an input unit, image teaching is performed while the image displayed on the display unit is set to a setting object image. A measurement item which is of a candidate of a measurement process including specification of a reference position is displayed as the measurement process to accept selection. Specification of cutout area which constitutes one measurement target region is accepted, a measurement point including a local region or a feature point which is used for the measurement is automatically set in the measurement target region based on pieces of information on the set measurement process and reference position.

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Fukuchiyama, Japan

Tokiko Inoue