Hitachi Construction Machinery Co., Ltd.

Hitachi Kenki Fine Tech Co., Ltd.

Tohru Miyata

Yukio Arima

Toshiyuki Utsuki

Toshihiko Wada

Hiroaki Nakashima

Takenori Hiroki

Yuichi Kunitomo

Shigeru Miwa

Shigenori Aoki

Toshihiro Kimura

Naoya Kawakami

Hajime Mizunoya

Toshiyuki Hebaru

Noboru Yamamoto

Makoto Ishijima

Seigo Kikuchi

An ultrasonic inspection apparatus obtains information on the interface of a sample as digital waveform data for any &ldquo;unit measurement range&rdquo; and is provided with at least two data memories and controlled by a scan state monitoring signal showing the scan state of a unit measurement range belonging to a first group or a unit measurement range belonging to a second group. A comparator-register/memory-control-circuit outputs the scan state monitoring signal to the two data memories. The operating states of the two data memories being controlled by the scan state monitoring signal to alternate between writing of digital waveform data and readout of digital waveform data.

Ultrasonic inspection apparatus

A non-destructive inspection device has an inspection unit body and a support casing which is used as a set-up type device by combining the inspection unit body and the support casing in ordinary inspection, and is used as a portable type device by separating them for special inspection situations involving narrow places or high places. The support casing can be freely combined to or separated from the inspection unit body. When combining the two components, the non-destructive inspection device can carry out the inspection based on a stable set-up mode in the same way as conventional devices. When separated, the inspection unit body is used as a portable device.

Portable non-destructive inspection device and support casing therefor

Ultrasonic inspection and imaging instrument

Control unit for an ultrasonic flaw detector

Ultrasonic flaw detector system

Growing community of inventors

Tsuchiura, Japan

Tohru Miyata