Verigy (singapore) Pte. Ltd.

Verigy Ipco

Todd Sholl

Stephen Bellato

Sanjeev Grover

Benson Morris

Romi Mayder

Randy L Bailey

Noriyuki Sugihara

Kenneth D Karklin

Andrew Tse

Nasser Ali Jafari

There is disclosed apparatus for routing signals between at least one PCB within a test head and a socket card assembly. In an embodiment, the apparatus may include at least one flexible circuit electrically connecting first and second sides of the PCB and the socket card assembly with one another, and the flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Methods of routing signals between at least one PCB within a test head and a socket card assembly are disclosed. In one embodiment, a method may include electrically connecting first and second sides of the PCB and the socket card assembly with one another with at least one flexible circuit having a defined shape configured to interface with the socket card assembly and the PCB along substantially perpendicular planes. Other embodiments are also disclosed.

System, method and apparatus using at least one flex circuit to connect a printed circuit board and a socket card assembly that are oriented at a right angle to one another

A screw-less latching system for securing load boards comprises a frame and a backer plate. The frame includes a loading site for a device under test. The loading site includes a first tee clamp disposed along a first longitudinal axis and a second tee clamp disposed along a second longitudinal axis of the loading site. The loading site further includes a first spring plunger disposed along a first lateral axis of the loading site. The backer plate is configured to attach the device under test. The backer plate includes two lock tabs coupling with the first and second tee clamps. The backer plate further includes a first recess coupling with the first spring plunger.

Screw-less latching system for securing load boards

A parallel calibration system for an electronic circuit tester comprises test and measurement electronics, a test fixture coupled to the test and measurement electronics, the test fixture comprising clock reference circuitry and clock distribution circuitry, a device under test interface, and a plurality of calibration boards coupled to the device under test interface, wherein the plurality of calibration boards and the clock distribution circuitry simultaneously test the signal paths of a plurality of test channels.

Parallel calibration system for a test device

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San Jose, CA, United States of America

Todd Sholl