Nokomis, Inc.

Other

Todd Eric Chornenky

Walter John Keller

Andrew Richard Portune

William Anthony Davis

Walter J Keller, Iii

James Robert Uplinger, Ii

Karen Heike Spieler Canne

Bogdan Amaru Pathak

Robert Michael Nichol

Daniel Chornenky

Adam Brant

David J Kania

Adam Taylor Brant

Iii Walter John Keller

An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.

Method and apparatus for detection and identification of counterfeit and substandard electronics

A receiver includes a circuit designed to process, based on a plurality of timed waveform reference locations, a waveform signal, the waveform signal comprising a message. The circuit may include a clock source, an input configured to receive the waveform signal, a time location reference circuit coupled to the clock source, the time location reference circuit designed to output the plurality of timed waveform reference locations, each timed waveform reference location being set by the clock, and a signal processing circuit coupled to the time location reference circuit, the signal processing circuit designed to generate an output voltage in a response to the waveform signal being inputted into the signal processing circuit through the input and processed at each timed waveform reference location from the series of timed waveform reference locations. A transmitter that generates the waveform signal can be also provided where the clocks are matched.

Direct conversion receiver using coherent integration

A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture within a shielded enclosure by analysis of emission metrics. The testing fixture can include a first layer with a capacitive member and a second layer with a cavity to receive a microelectronic part. A filter in a transmission chain can pass a high power signal to the fixture. A filter in a receving chain can pass a low power signal to the analysis unit.

Testing of microelectronics device and method

An apparatus and method to transmit and receive messages within and near the noise floor by pulsed signals that are time synchronized and are not easily intercepted by use of frequency and time slots as well as intermittent transmissions.

Synchronized multi-channel communication device and method

An intelligent multiple antenna and radio interconnect optimizer includes an antenna port suitable for a connection to an antenna, a radio port suitable for a connection to a radio, a machine readable identifier coupled to one of the antenna port, the radio port and a combination thereof, the machine readable identifier suitable to identify a feature in each of a radio being connected to the radio port and an antenna being connected to the antenna port, a radio frequency (RF) switch configured to connect the antenna port with the radio port in a response to a connection permission signal from the machine readable identifier when the feature in the radio matches the feature in the antenna, and a controller configured to receive antenna and radio port location inputs from the machine readable identifier, and control operation of the RF switch.

Intelligent multiple antenna and radio interconnect optimizer and method

A method for creating an enhanced multipaction resistant diamond-like coating (DLC) coating with lower Secondary Electron Emission (SEE) properties is performed on an initial surface by etching a DLC coating deposited on the surface after deposition and optionally creating interlayers to enhance adhesion mechanical properties between the DLC coating and the initial surface.

Method of enhancing a DLC coated surface for enhanced multipaction resistance

A device to extract digital and unintended analog signals from a data bus with a non-contact common mode probe and a differential mode probe, each with a low noise amplifier. The analog and digital signals can be monitored contemporaneously.

Integrated data bus RF signature extraction and amplification

A hand-held apparatus for analysis, testing, inspecting and/or screening a fully integrated and assembled electrically powered assets and devices for measurement of degree of device aging, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an on-board antenna positioned at a distance from the electrically powered device under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to electronic devices. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.

Electronics equipment testing apparatus and method utilizing unintended RF emission features

Compound detection or testing apparatus includes a microwave power supply, an antenna electrically coupled to the microwave power supply, the antenna adapted to emit energy during use of the apparatus, the antenna further adapted to receive an unabsorbed energy from the material and generate a signal defining the unabsorbed energy, a processing components configured to process the signal and determine a concentration of the compound on/in the fabric material and a reporting member coupled to each of the power supply and the processing member the reporting component configured to communicate the concentration of the compound on/in the fabric material. The apparatus may be configured as a hand-held sensor.

Apparatus for chemical concentration determination using microwave spectroscopy

An apparatus for testing, inspecting or screening an electrically powered device for modified or unmodified hardware, firmware or software modifications including Malware, Trojans, adware, improper versioning, worms, or virus and the like, includes an antenna positioned at a distance from the electrically powered device and a signal receiver or sensor for examining a signal from the electrically powered device. The receiver or sensor collects unintended RF energy components emitted by the electrically powered device and includes one or more processors and executable instructions that perform analysis in a response to the acquired signal input while the electrically powered device is active or powered. The characteristics of the collected RF energy may be compared with RF energy characteristics of an unmodified device. The comparison determines one of a modified, unmodified or score of certainty of modified condition of the electrically powered device.

Detection of malicious software, firmware, IP cores and circuitry via unintended emissions

An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the electrical device.

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Carmichaels, PA, United States of America

Todd Eric Chornenky