International Business Machines Corporation

Globalfoundries Inc.

Todd Edwin Leonard

Kenneth Joseph Goodnow

Peter Albert Twombly

Gregory John Mann

Serafino Bueti

Hayden C Cranford, Jr

Charles S Woodruff

Sebastian Theodore Ventrone

Igor Arsovski

Brian John Connolly

Joseph Andrew Iadanza

Anthony Richard Bonaccio

Peter Anthony Sandon

Pradeep Thiagarajan

Hemen R Shah

Stephen Gerard Shuma

Carrie Ellen Cox

Kyle E Schneider

John Joseph Bergkvist, Jr

Gary Scott Delp

Jonathan W Byrn

Albert Alfonse Slane

Jason Michael Norman

Philip Lynn Leichty

Gary Paul McClannahan

Kevin Gerard Plotz

Mark William Branstad

John Emery Nordman

John Handley Shaffer

Jonathan P Ebbers

Clarence Rosser Ogilvie

Steven Mark Clements

Nathaniel Douglas Hieter

Alfred Degbotse

Jonathan H Raymond

Adam J Courchesne

Suzanne Granato

Peter James Osler

Ming-i Mark Lin

John K Koehler

Eze Kamanu

Joseph A Iandanza

Charles Kenneth Hines

Ramnath Ravindran

Jonathan Phillip Ebbers

Kyle Emil Schneider

Aligning FIFO pointers includes resetting, by a write control block coupled to a write side of the FIFO, write pointers to an initial value. Then, iteratively, until one or more bits retrieved from the write side match one or more bits of an alignment bit pattern: providing, by the write side to the read side, the alignment bit pattern; retrieving, by the read side, one or more bits from the write side; providing, by the read side through a read control block, the retrieved one or more bits to the write control block; determining, by the write control block, whether the retrieved one or more bits match one or more bits of the alignment bit pattern; and, if the retrieved one or more bits do not match one or more bits of the alignment bit pattern, suppressing the read pointer from incrementing for a predetermined period of time.

Aligning FIFO pointers in a data communications lane of a serial link

An electrically conducting, vertically displacing microelectromechanical system (MEMS) is formed on a first integrated circuit chip. The first integrated circuit chip is physically connected to a three-dimensional packaging structure. The three-dimensional packaging structure maintains a fixed distance between the first integrated circuit chip and a second integrated circuit chip. A control circuit is operatively connected to the MEMS. The control circuit directs movement of the MEMS between a first position and a second position. The MEMS makes contact with a contact pad on the second integrated circuit chip when it is in the second position forming a conductive path and providing electrical communication between the first integrated circuit chip and the second integrated circuit chip. The MEMS avoids making contact with the contact pad on the second integrated circuit chip when it is in the first position.

Three-dimensional inter-chip contact through vertical displacement MEMS

Structures and methods for self-powered devices are disclosed herein. Specifically, disclosed herein is a stacked, three-dimensional integrated circuit including a power generation die including a power source. The integrated circuit also includes a functional system die including one or more functional components that are powered by power generated by the power source. The power generation die and the functional system die are stacked in a three-dimensional structure.

Three-dimensional chip stack for self-powered integrated circuit

Methods and apparatuses for adaptable receiver detection are provided. Embodiments include providing, by receiver detection circuitry at a transmitter coupled to a communication link, a voltage to the communication link; determining, by the receiver detection circuitry, a rise time corresponding to a rising edge change of the voltage on the communication link; determining, by the receiver detection circuitry, a fall time corresponding to a falling edge change of the voltage on the communication link; and determining, by the receiver detection circuitry, whether the rise time and the fall time are consistent with the transmitter being coupled through the communication link to a remote receiver.

Adaptable receiver detection

A system and method of allocating a job submission for a computational task to a set of distributed server farms each having at least one processing entity comprising; receiving a workload request from at least one processing entity for submission to at least one of the set of distributed server farms; using at least one or more conditions associated with the computational task for accepting or rejecting at least one of the server farms to which the job submission is to be allocated; determining a server farm that can optimize the one or more conditions; and dispatching the job submission to the server farm which optimizes the at least one of the one or more conditions associated with the computational task and used for selecting the at least one of the server farms.

Environmental and computing cost reduction with improved reliability in workload assignment to distributed computing nodes

A source-series terminated ('SST') driver circuit that includes: one or more data signal inputs; one or more control signal inputs; a driver output; and a plurality of driver cells, the driver cells coupled in parallel to one another, outputs of the driver cells coupled together to form the driver output of the SST driver circuit, where output resistance of the SST driver circuit varies in dependence upon activation of one or more of the parallel driver cells, activation of each driver cell controlled by control signals received at the control signal inputs.

Source series terminated driver circuit with programmable output resistance, amplitude reduction, and equalization

An integrated circuit (IC) including a warranty and enforcement system, and a related design structure and HDL design structure are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded.

Warranty monitoring and enforcement for integrated circuit and related design structure

A method and accompanying system are disclosed for tuning each channel of a high-speed SerDes link interface arranged in a configuration linking a local side to a remote side. The method includes transmitting a flow control packets from the local side to the remote side to change remote side transmission characteristics in a link channel; monitoring the bit error rate (BER) in the link channel; transferring additional flow control packets to adjust the remote side transmission characteristics; and processing the BER data at the local side to generate the remote side transmission characteristics for the link channel.

System and method for improving equalization in a high speed serdes environment

A design structure including universal peripheral processor architecture on an integrated circuit (IC) includes a first data bus and a second data bus communicating with first and second ternary content addressable memory (TCAM) devices configured as state machines. First and second processors are coupled to the first bus interface logic and the second bus interface logic. First and second data storage devices communicate with the first and second processors and are coupled to the first and second data buses and communicate with each other. The TCAM devices are configured as state machines and are coupled to and adapted to interface with the processors, the data storage devices, and the bus interface logic using predefined protocols.

Structure for hardware assisted bus state transition circuit using content addressable memories

Disclosed are embodiments of on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors. In each embodiment the resulting pattern of shorts and opens, can be used as an on-chip identifier or private key.

On-chip identification circuit incorporating pairs of conductors, each having an essentially random chance of being shorted together as a result of process variations

A CRC redundancy calculation circuit and a design structure including the circuit embodied in a machine readable medium are presented. The CRC redundancy calculation circuit is pipelined to run at high frequencies and configured to operate on an arbitrary multiple of the base granularity of the data packet. Additionally, the CRC redundancy calculation circuit provides the same multiple of outputs that provide intermediary output remainder values. Thus, for example, a circuit which processes 24 bytes of packet data per cycle and which the packets have a 4 byte granularity, the CRC redundancy calculation circuit provides 6 output remainder values, one for each 4 byte slice of data.

Apparatus for pipelined cyclic redundancy check circuit with multiple intermediate outputs

Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path. The invention is also directed to a design structure on which a circuit resides.

Dynamic critical path detector for digital logic circuit paths

Method and systems of powering on an integrated circuit (IC) are disclosed. In one embodiment, the system includes a region in the IC including functional logic, a temperature sensor for sensing a temperature in the region when the IC is powered up and a heating element therefor; a processing unit including: a comparator for comparing the temperature against a predetermined temperature value, a controller, which in the case that the temperature is below the predetermined temperature value, delays functional operation of the IC and controls heating of the region of the IC, and a monitor for monitoring the temperature in the region; and wherein the controller, in the case that the temperature rises above the predetermined temperature value, ceases the heating and initiates functional operation of the IC.

Method and systems of powering on integrated circuit

Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path.

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Williston, VT, United States of America

Todd Edwin Leonard