Asylum Research Corporation

Oxford Instruments, Inc.

Oxford Instruments Afm Inc

Todd Day

Roger B Proksch

Jason Paul Cleveland

Dan Bocek

Mario Viani

Clint Callahan

A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently 'perfect' in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.

Fully digitally controller for cantilever-based instruments

An apparatus for simulating a tactile interface with the relative position of the probe of a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, or the force between the probe and a sample. The device can be easily incorporated into existing control electronics for such instruments or can be incorporated into a relatively small and simple hand-held device to be used with such instruments.

Tactile force and/or position feedback for cantilever-based force measurement instruments

Fully digital controller for cantilever-based instruments

Growing community of inventors

Santa Barbara, CA, United States of America

Todd Day