Growing community of inventors

Meridian, ID, United States of America

Todd A Dobson

Average Co-Inventor Count = 5.00

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 87

Todd A DobsonGuy F Hudson (8 patents)Todd A DobsonBrian F Gordon (8 patents)Todd A DobsonHugh E Stroupe (7 patents)Todd A DobsonRussell C Zahorik (6 patents)Todd A DobsonRenee Zahorik, Legal Representative (1 patent)Todd A DobsonRussell C Zahorik, Deceased (1 patent)Todd A DobsonHugh F Stroupe (1 patent)Todd A DobsonTodd A Dobson (8 patents)Guy F HudsonGuy F Hudson (45 patents)Brian F GordonBrian F Gordon (29 patents)Hugh E StroupeHugh E Stroupe (34 patents)Russell C ZahorikRussell C Zahorik (41 patents)Renee Zahorik, Legal RepresentativeRenee Zahorik, Legal Representative (3 patents)Russell C Zahorik, DeceasedRussell C Zahorik, Deceased (2 patents)Hugh F StroupeHugh F Stroupe (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Micron Technology Incorporated (8 from 37,950 patents)


8 patents:

1. 8053371 - Apparatus and methods for selective removal of material from wafer alignment marks

2. 7244681 - Methods for selective removal of material from wafer alignment marks

3. 6889698 - Apparatus for selective removal of material from wafer alignment marks

4. 6610610 - Methods for selective removal of material from wafer alignment marks

5. 6530113 - Apparatus for selective removal of material from wafer alignment marks

6. 6447634 - Method and apparatus for selective removal of material from wafer alignment marks

7. 6329301 - Method and apparatus for selective removal of material from wafer alignment marks

8. 6103636 - Method and apparatus for selective removal of material from wafer

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as of
12/20/2025
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