Friedrich-schiller-universitat Jena

Leibniz-institut Fur Photonische Technologien E.v.

Fraunhofer-gesellschaft Zur Foerderung Der Angewandten Forschung E.v.

Tobias Meyer-Zedler

Jens Limpert

Andreas Tünnermann

Stefan Nolte

Jürgen Popp

Thomas Gottschall

Michael Schmitt

Roland Ackermann

An exemplary laser microscope can be provided, comprising at least one first laser source which emits at least one (e.g., pulsed) excitation beam, a scanning optical configuration (e.g., configured to scan the excitation beam over the surface of a sample), a focusing optical configuration (e.g., configured to focus the excitation beam onto the sample), and at least one detector configured to detect light emitted by the sample due to an optical effect in response to the excitation beam. A second laser source facilitates a pulsed ablation beam for a local ablation of the material of the sample. The ablation beam can be guided to the sample via the scanning and focusing optical configurations. The first and second laser sources can be fed by a mutual continuous wave pump laser and/or a mutual pulsed pump laser. The first laser source can emit pulses with at least two different wavelengths.

Laser microscope with ablation function

Growing community of inventors

Jena, Germany

Tobias Meyer-Zedler