Stichting Imec Nederland

Tobias Gemmeke

Mario Konijnenburg

Julien Penders

Carlos Agell

Maryam Ashouei

A memory control system for controlling read and write operations of a non-volatile memory, wherein the memory control system comprises a memory controller that is adapted to implement a write operation for writing at least one block of data to the memory as a sequence of memory write and validation cycles for part of all of the data. In one example, the number of cycles is a function of the amount of successfully written data per cycle and is thus variable in dependence on the success of the data writing. The system also includes a power management unit, which is adapted to authorize or prevent the memory controller from conducting the write operation at the level of the write cycles thereby to control the timing of power consumption resulting from the cycles of the write operation.

Memory control system for a non-volatile memory and control method

The present disclosure relates to a detection circuit formed as part of an integrated circuit. In one example, the detection circuit includes a signal generator configured to generate a reference signal, and an amplification circuit comprising a p-channel transistor and an n-channel transistor, wherein the amplification circuit is affected by a variability that also affects a functional circuit formed as part of the integrated circuit. The variability causes the p-channel transistor and the n-channel transistor to have different respective drive strengths. The amplification circuit is configured to receive the reference signal and to provide an amplified signal representative of a difference in the respective drive strengths, wherein the reference signal is more insensitive to the variability than the amplified signal. The present disclosure also relates to an integrated circuit and a method for detecting and compensating a transistor mismatch.

Circuit and method for detection and compensation of transistor mismatch

An apparatus for monitoring timing of a plurality of critical paths of a functional circuit includes a plurality of canary circuits, each configured to be coupled to a critical path of a functional circuit for detecting and outputting critical timing events. Each canary circuit includes an adjustable delay element and an analyzer circuit for receiving a count of the critical timing event output from at least one of the plurality of canary circuits for a predetermined time interval for a plurality of delay values of the adjustable delay elements and for determining a probability distribution of critical timing events of the at least one of the plurality of critical paths for the predetermined time interval for the plurality of delay values.

Growing community of inventors

Straelen, Germany

Tobias Gemmeke