International Business Machines Corporation

Universiteit Leiden

Tjerk Oosterkamp

Daniel Rugar

Harry Jonathon Mamin

Arthur Den Haan

Jelmer Wagenaar

Rembrandt Donkersloot

A magnetic resonance force detection apparatus, comprising: a sample carrier for carrying a sample to be tested; a magnetic field source configured to provide a magnetic field to a sample when it is carried by the sample carrier; a support for supporting either the sample carrier or the magnetic field source; a support-driving-mechanism configured to drive the support such that the sample carrier moves relative to the magnetic field source, such that the magnetic field is configured to cause the spins of one or more nuclei or electrons in the sample to flip, and wherein the flipping of spins exerts a force on the support; and a support-displacement-measuring-sensor configured to measure displacement of the support and generate a signal representative of the displacement of the support.

Magnetic resonance force detection apparatus and associated methods

A magnetic resonance force detection apparatus, comprising a sample carrier for carrying a sample to be tested, a magnetic field source and a support for supporting either the sample carrier or the magnetic field source. The magnetic field source is configured to expose the sample to a magnetic field by simultaneously providing a plurality of volumes in which the magnetic field is configured to cause the spins of one or more nuclei or electrons in the sample to flip, and wherein the flipping of spins exerts a force on the support. The apparatus also comprises a support displacement measuring sensor configured to measure the displacement of the support and generate a signal representative of the displacement of the support, and a processor configured to process the signal representative of the displacement of the support in order to determine a component of the displacement of the support caused by one or more of the plurality of volumes.

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Leiden, Netherlands

Tjerk Oosterkamp