Realtek Semiconductor Inc.

Ting-ying Wu

Tze-Min Shen

Shih-hung Wang

Wei-zhi Chen

Ming-sheng Peng

A layout method is configured to design a layout of a bridging circuit between source circuit and a destination circuit of a circuit system. The layout method includes: categorizing the bridging circuit into sub-regions according to physical structural characteristics; obtaining default sub-region model units corresponding to the sub-regions from a database; setting the default sub-region model units by the parameters to obtain sub-region models; extracting, using an electromagnetic simulation software, electrical models from the sub-region models, respectively; connecting the sub-region models to obtain, using a circuit simulation software an entire electrical model; evaluating whether the entire electrical model meets a specific requirement of the bridging circuit with respect to the circuit system; and when the entire electrical model meets the specific requirement, obtaining a layout rule according to the sub-region models.

Layout method and related non-transitory computer-readable medium

A signal quality optimization system and a signal quality optimization method are provided. The method includes: executing a ZQ calibration process on an off-chip driver (OCD) circuit of a first circuit and an on-die termination (ODT) circuit of a second circuit to obtain calibrated resistor quantities; performing a waveform test process, including: setting a predetermined time rule to determine an operation success condition, adjusting the OCD circuit according to the calibration calibrated quantity corresponding to a target ODT resistance, obtaining a signal eye diagram, and obtaining an adjustable resistor ratio by performing adjustments and tests; extracting the OCD resistance value with the highest adjustable resistor ratio to obtain preferred ODT-OCD resistance combinations; and configuring the ODT circuit and the OCD circuit according to the preferred ODT-OCD resistance combinations, and testing the preferred ODT-OCD resistance combinations to obtain an optimized ODT-OCD resistance combination according to test results.

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HSINCHU, Taiwan

Ting-ying Wu