Micron Technology Incorporated

Sandisk Technologies Inc.

Ting Luo

Jianmin Huang

Harish Reddy Singidi

Xiangang Luo

Kulachet Tanpairoj

Preston Allen Thomson

Kishore Kumar Muchherla

Sebastien Andre Jean

Guang Hu

Ashutosh Malshe

Tao Liu

Sampath K Ratnam

Peter Sean Feeley

Chun Sum Yeung

Jung Sheng Hoei

Giuseppe D'Eliseo

Ankit Vinod Vashi

Nian Niles Yang

Zhenming Zhou

Deping He

Christopher Joseph Bueb

Scott Anthony Stoller

Devin M Batutis

Cheng Cheng Ang

Luca Porzio

Murong Lang

Michael G Miller

Tomoko Ogura Iwasaki

Niles Yang

Phong Sy Nguyen

Lawrence Celso Miranda

Sheyang Ning

Luyen Tien Vu

Falgun G Trivedi

John Zhang

Chun Sum Yueng

Eric Yuen

Idan Alrod

Vamsi Pavan Rayaprolu

Jonathan Scott Parry

Dana Lee

Zhengang Chen

Chris Avila

Gautam Ashok Dusija

Gary F Besinga

Walter Di Francesco

Changyuan Chen

Zhongguang Xu

Umberto Siciliani

Uday Chandrasekhar

Guirong Liang

Chris Nga Yee Avila

Antonino Pollio

Renato Padilla, Jr

Dionisio Minopoli

Giuseppe Ferrari

Luigi Esposito

Li-Te Chang

Christina Papagianni

Gianluca Coppola

Anna Chiara Siviero

Anna Scalesse

Bhuvan Khurana

Ciro Feliciano

Ryan Laity

Allison Jayne Olson

Chun Lei Kong

Aik Boon Edmund Yap

Methods, systems, and devices for data block refresh during read access are described. In some instances, when an access command (e.g., a read command) is received, a memory system may determine if the associated block is a PSA block. If the block is PSA block, its data may be provided to a host system to satisfy the read command and the block may either be refreshed or may be designated to be refreshed. For example, the block may be refreshed by copying its data to a write cache and writing the data from the cache to a new block. In other instances, an LBA of the block may be stored (e.g., designated) and the LBA may be refreshed when the memory system is idle.

Data block refresh during read access

Methods, systems, and devices for techniques for data refresh based on environmental conditions are described. A memory system may program data to a set of blocks, where an order in which the data be programmed to respective blocks of the set of blocks may be based on a first block ordering. The memory system may also program respective indications of respective temperatures of the programming for the respective blocks. The memory system may identify, during a start-up procedure, a flag indicating to perform a refresh operation for the set of blocks. As such, the memory system may perform during the start-up procedure, the refresh operation for the set of blocks using a second block ordering. In some examples, the second block ordering may be based on the respective indications of the respective temperatures for the set of blocks.

Techniques for data refresh based on environmental conditions

Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to generate virtual or superblocks using multiple partial good blocks. The controller identifies a first partial good block (PGB) in a set of memory components, the first PGB having first subset of word line groups (WGRs) that are categorized as being non-defective. The controller searches for a second PGB in the set of memory components having a second subset of WGRs that are categorized as being non-defective. The controller computes a total quantity of WGRs based on the first quantity of WGRs in the first subset of WGRs and a second quantity of WGRs in the second subset of WGRs and, in response, combines the first PGB and the second PGB to form an individual virtual block.

Generating virtual blocks using partial good blocks

A system comprises a memory device including a plurality of management units and a processing device. The processing device is operatively coupled with the memory device and configured to place the plurality of management units into a first protective state by erasing the plurality of management units, identify a cursor satisfying a cursor definition, identify a subset of the plurality of management units based on a location, on the memory device, referenced by the cursor, and place a selected management unit of the subset of the plurality of management units into a second protective state by programming a protective data pattern to the selected management unit.

Memory pattern management for improved data retention in memory devices

Methods, systems, and devices for read window management in a memory system are described. A memory system may determine, for a set of memory cells, a first value for a read window that is associated with a set of one or more threshold voltages each representing a different multi-bit value. The memory system may then use the first value for the read window to predict a second value for the read window. Based on the second value for the read window, the memory system may predict an error rate for the set of memory cells. The memory system may then set a value for an offset for a threshold voltage of the set of one or more threshold voltages based on the error rate.

Read window management in a memory system

Methods, systems, and devices for setting switching for single-level cells (SLCs) are described. A memory system may receive an access command from a host. The access command may correspond to an SLC block or to a multiple-level cell block. If the access command corresponds to an SLC block, the memory system may modify the access command to include one or more bits indicating a setting to use for performing the access operation corresponding to the access command. The setting may define one or more operating parameters for performing the access operation. The memory system may use bits to indicate the setting that are used to indicate a page address for multiple-level cell blocks. The memory system may issue the access command to a memory device, which may perform the access operation using the setting indicated in the one or more bits included by the memory system.

Setting switching for single-level cells

Methods, systems, and devices for cross-temperature mitigation in a memory system are described. A memory system may determine a first temperature of the memory system. Based on the first temperature satisfying a first threshold, the memory system may write a set of data to a first block of the memory system that is configured with a first rate for performing scan operations to determine error information for the first block. The memory system may then determine a second temperature of the memory system after writing the set of data to the first block. Based on the second temperature satisfying a second threshold, the memory system may transfer the set of data to a second block of the memory system that is configured with a second rate for performing scan operations to determine error information for the second block.

Cross-temperature mitigation in a memory system

Apparatus might include an array of memory cells and a controller for access of the array of memory cells. The controller might be configured to cause the apparatus to apply a sense voltage level to a control gate of a memory cell of the array of memory cells, generate N determinations whether the memory cell is deemed to activate or deactivate while applying the sense voltage level, wherein N is an integer value greater than or equal to three, deem the memory cell to have a threshold voltage in a first range of threshold voltages lower than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell, and deem the memory cell to have a threshold voltage in a second range of threshold voltages higher than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell.

Apparatus for determining memory cell data states

Described are systems and methods related to a memory block erase protocol. An example system includes a memory device having a memory array including a plurality of memory cells. The system further includes a processing device coupled to the memory device. The processing device is to determine a value of a metric associated with the memory array. Responsive to determine that the value of the metric is below a predetermined threshold, the processing device is further to initiate an erase protocol of the memory device. The processing device is further to erase sets of memory cells associated with one or more memory blocks of the memory array. The processing device is further to receive a programming command directed to the first set of memory cells. The processing device is further to perform a programming operation with respect to a set of memory cells responsive to receiving the programming command.

Memory block erase protocol

Methods, systems, and devices for skipping pages for weak wordlines of a memory device during pre-programming are described. A memory device may be configured to operate in a first mode involving skipping one or more pages (e.g., a lower page (LP)) associated with a set of wordlines. In some examples, a testing system may determine the set of wordlines (e.g., weak wordlines) for which to skip pages according to performance degradation for the wordlines in response to applying a threshold temperature to a test memory device. In the first mode, the memory device may store (e.g., pre-program) data in a subset of pages distinct from the skipped pages. The memory device may switch to a second mode in response to a trigger condition. In the second mode, the memory device may use each page associated with the wordlines and may refrain from skipping the one or more pages.

Skipping pages for weak wordlines of a memory device during pre-programming

A method includes determining a first memory access count threshold for a first word line of a block of memory cells and determining a second memory access count threshold for a second word line of the block of memory cells. The second memory access count threshold can be greater than the first memory access count threshold. The method can further include incrementing a memory block access count corresponding to the block of memory cells that includes the first word line and the second word line in response to receiving a memory access command and refreshing the first word line when the memory block access count corresponding to the block of memory cells is equal to the first memory access count threshold.

Memory sub-system refresh

Methods, systems, and devices for a corrective read of a memory device with reduced latency are described. A memory system may identify a read error based on accessing a memory device, and may select a trim setting for a performing a corrective read operation based on a data retention condition associated with the accessed memory device. Such a data retention condition may be associated with a data retention duration, or a cross-temperature condition, among other criteria or combinations thereof. In some implementations, the memory system may select from a subset of possible trim settings, which may be associated with relevant process corners. For example, the memory system may select between a first trim setting that is associated with a relatively large cross-temperature and a relatively short data retention duration and a second trim setting that is associated with a relatively small cross-temperature and a relatively long data retention duration.

Corrective read of a memory device with reduced latency

A method includes receiving a command to write data to a memory device and writing the data to a first memory tier of the memory device. The first memory tier of the memory device is a dynamic memory tier that utilizes single level cells (SLCs), multi-level cells (MLCs), and triple level cells (TLCs). The method further includes migrating the data from the first memory tier of the memory device to a second memory tier of the memory device. The second memory tier of the memory device is a static memory tier that utilizes quad level cells (QLCs).

Memory sub-system data migration

Apparatus and methods for determining memory cell data states

Systems and methods are disclosed, including maintaining an error recovery data structure for a set of codewords (CWs) in a storage system, the error recovery data structure storing indications that specific CWs are correctable or not correctable by specific error handing (EH) steps of a set of multiple EH steps, and determine an order of EH steps for the storage system based on the error recovery data structure. Maintaining the error recovery data structure can include determining if each CW of the set of CWs is correctable by a specific EH step, storing indications of CWs determined correctable by the specific EH step in the error recovery data structure, and, in response to determining that one or more CW in the set of CWs are not indicated as correctable in the error recovery data structure, incrementing the specific EH step.

Read error recovery

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Santa Clara, CA, United States of America

Ting Luo