Global Unichip Corporation

Taiwan Semiconductor Manufacturing Comp. Ltd.

Ting-Hao Wang

Pei-Ju Lin

Yu-Chu Chen

Po-Shing Yu

Chia-Hsiang Chang

Hsiang-Wei Liu

Igor Elkanovich

Amnon Parnass

Ting-Chin Cho

Jen-Wei Tsai

Hui-Ting Yang

Yung-Sheng Fang

Hsin-Han Han

Hao-Che Hsu

Po-Chen Lee

Shih-Chun Lo

Ming-Fu Tsai

Wen-Juh Kang

Ting-Hsu Chien

Pei Yu

Jia-Liang Chen

Jieh-Tsorng Wu

Tsai-Ming Yang

Chang-Ming Liu

Yen-Chung Tony Chen

Yuan-Hung Lin

Shi-Hao Chen

Li-Hua Lin

Yu-Ju Chang

Chung-Kai Wang

Chao-Ching Huang

Tsung-Ping Chou

Li-Ya Tseng

Ming-Hsuan Wang

Yen-Chih Chiu

Hung-Chun Li

Shih-Han Yeh

Wen-Hsien Chuang

Chiung-Chi Lin

Shao-Hua Wan

Yen-Wei Chen

Zanyu Yang

Chun-Hsu Chen

Hui-Wen Tsai

Jun-Wan Wu

Yi-Ming Wang

A method of measuring chip characteristics includes: outputting an operating voltage to a chip by a test device, wherein the chip comprises a plurality of oscillator circuits configured to generate a plurality of oscillating signals according to the operating voltage; and testing the chip by the test device under a situation that the test device outputs a system clock signal having a first clock period to the chip, including: changing the operating voltage sequentially with the test device until the chip changes from a normal state to a failure state, so as to generate a boundary operating voltage; and recording the plurality of oscillating signals generated according to the boundary operating voltage as measurement data by the test device, wherein the measurement data represents chip characteristics of the chip corresponding to the first clock period.

Method of measuring chip characteristics, test device and non-transitory computer readable media

A temperature sensing device and a temperature sensing method are provided. The temperature sensing device includes a sensor and a conversion circuit. The sensor generates a first sensing signal and a second sensing signal corresponding to a temperature based on different conditions. The conversion circuit performs a subtraction operation on the first sensing signal and the second sensing signal to obtain a result difference value, calculates a compensation value according to the result difference value and the first sensing signal, multiplies the result difference value and the compensation value to obtain a multiplication value, subtracts the multiplication value from the first sensing signal to generate a first value, adds the multiplication value to the first sensing signal to generate a second value, and divides the first value by the second value to generate an output value. The second value is a constant.

Temperature sensing device and temperature sensing method

A calibration system includes a jitter-capturing analog-to-digital converter (ADC), a calibration value generating circuit and a first calculation circuit. The jitter-capturing ADC is configured to sample a to-be-sampled clock signal according to an operating clock signal to generate a first quantized output. The calibration value generating circuit is configured to receive the first quantized output and a second quantized output of a to-be-calibrated ADC to generate a calibration value. The operating clock signal is for driving the to-be-calibrated ADC to sample, and the calibration value is related to a phase noise of the operating clock signal. The first calculation circuit is coupled with the calibration value generating circuit, and configured to subtract the calibration value from the second quantized output to generate a third quantized output.

Calibration system of canceling effect of phase noise and analog-to-digital converting device comprising the same

A digital-to-analog converter and an operation method thereof are provided. The digital-to-analog converter includes a current source module, a decoder, a change indicator, and a random number generator. The decoder is coupled to the current source module and receives a digital input signal. The change indicator is coupled to the decoder and provides an indication signal to the decoder. The random number generator is coupled to the change indicator and provides a random number signal to the change indicator. The change indicator generates an indication signal according to the random number signal, and the decoder generates a control signal to the current source module according to the digital input signal and the indication signal, so that the current source module generates an analog output signal corresponding to the digital input signal according to the control signal.

Digital-to-analog converter and operation method thereof

An analog-to-digital converting device includes N-stage first analog-to-digital converters (ADCs), a second ADC, a first calibration circuit, a data recovery circuit and an output circuit. The N-stage first ADCs has a first sampling frequency that is (N+1)/N times of a second sampling frequency, and converts an input signal into first quantized outputs. The second ADC has the second sampling frequency, and converts the input signal into a second quantized output. The first calibration circuit calibrates offsets of the first quantized outputs and the second quantized output to generate third quantized outputs and a fourth quantized output. The data recovery circuit outputs, by the second sampling frequency, one of the third quantized outputs as a fifth quantized output, and subtracts the fifth quantized output from the fourth quantized output to generate output data. The output circuit generates an output signal according to the third quantized outputs and the output data.

Analog-to-digital converting device and method of offset calibration

An interface of integrated circuit (IC) die includes a plurality of the contact elements formed as a contact element pattern corresponding to a parallel bus. The contact elements are arranged in an array of rows and columns and divided into a transmitting group and a receiving group. The contact elements of the transmitting group have a first contact element sequence and the contact elements of the receiving group have a second contact element sequence, the first contact element sequence is identical to the second contact element sequence. The contact elements with the first contact element sequence and the second contact element sequence are matched when the contact element pattern is geometrically rotated by 180&#xb0; with respect to a row direction and a column direction.

Interface of integrated circuit die and method for arranging interface thereof

A circuit is provided for providing a sampling clock to de-serializers in a communication physical layer. The circuit includes a slave delay lock loop (DLL), to receive an input clock and provide the sampling clock to the de-serializers. Further, a master DLL is included for receiving the input clock and outputting a control signal to the slave DLL to adjust a delay amount of the sampling clock of the slave DLL. The master DLL replicates a circuit of the slave DLL with a loop detection and determines the control signal for output.

Circuit for providing clock to de-serializer in communication physical layer

A temperature sensing device and a temperature sensing method are provided. The temperature sensing device includes a sensor and an analog-to-digital converter. The sensor generates a first sensing result corresponding to an ambient temperature based on a first condition and generates a second sensing result corresponding to the ambient temperature based on a second condition. The second sensing result is different from the first sensing result. The analog-to-digital divides the first sensing result and the second sensing result to obtain a quotient value and generates an output digital code value corresponding to the ambient temperature according to the quotient value.

A comparator circuitry includes an input pair circuit, a load circuit, and a compensation circuit. The input pair circuit is configured to compare a first input signal with a second input signal, in order to control a first bias current. The load circuit is coupled to the input pair circuit, and is configured to output an output signal having a first level from a first output terminal of the load circuit in response to the first bias current. The compensation circuit is coupled to the input pair circuit and the load circuit, and is configured to drain a compensation current from the first output terminal to a voltage source during a period that the load circuit generates the output signal having a first level, in which the voltage source is configured to provide a voltage having a second level.

Comparator circuitry

A performance calculation method suitable for a chip is provided. The chip includes oscillator circuit systems configured to generate oscillation signals and to sense operation states of the chip to adjust periods of the oscillation signals. The method includes following operations: when the chip is in a first operation state, constructing a first function according to the periods of the oscillation signals and a first performance value of the chip; when the chip is in a second operation state, constructing a second function according to the periods of the oscillation signals and a second performance value of the chip; adjusting coefficients of the first or second function according to trajectories of graphs of the first and second functions, so that the graphs of the first and second functions intersect at a coordinate point; constructing a performance function of the chip according to the first and second functions.

Performance calculation system, performance calculation method, and electronic device

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit, and a skew adjusting circuit. The ADC circuits convert an input signal according to interleaved clock signals, in order to generate first quantized outputs. The calibration circuit performs at least one calibration computation according to the first quantized outputs to generate second quantized outputs. The skew adjusting circuit determines calculating signals, to which the second quantized outputs correspond in a predetermined interval, and averages the calculating signals to generate a reference signal, and compares the reference signal with each of the calculating signals to generate detecting signals, and determines whether the detecting signals are adjusted or not according to a signal frequency to generate adjusting signals, in order to reduce a clock skew in the ADC circuits.

Analog to digital converter device and method for calibrating clock skew

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit, and a skew adjusting circuit. The ADC circuits convert an input signal according to interleaved clock signals, in order to generate first quantized outputs. The calibration circuit performs at least one calibration computation according to the first quantized outputs to generate second quantized outputs. The skew adjusting circuit determines maximum value signals, to which the second quantized outputs correspond in a predetermined interval, and averages the maximum value signals to generate a reference signal, and compares the reference signal with each of the maximum value signals to generate detecting signals, and determines whether the detecting signals are adjusted or not according to a signal frequency to generate adjusting signals, in order to reduce a clock skew in the ADC circuits.

A frame decoding circuit implemented in an IC die includes a frame synchronizer, receiving an input clock signal and an input frame signal in serial form, to provide an output clock signal. A phase shift of the output clock signal is adjusted according to a detected code by sampling the input frame signal at a center point for every two bits and the detected code being not a correct type. The input clock signal is divided in frequency with the phase shift for providing the output clock signal. A de-serializer unit receives the input frame signal, the input data, the output clock signal from the frame synchronizer, a delay-locked-loop clock signal to de-serialize the input frame signal and the input data for output.

Frame decoding circuit and method for performing frame decoding

An analog-to-digital converting system includes multiple stages of analog-to-digital converters (ADCs) and a skew calibration circuit. The multiple stages of ADCs are configured to sample a test signal according to multiple interleaved clock signals, respectively, so as to respectively generate multiple stages of quantized outputs. The analog-to-digital converting system has a sampling frequency resulting from operations of the multiple stages of ADCs. The test signal has a first frequency and the sampling frequency is N times the first frequency, and N is an odd number larger than 1. The skew calibration circuit is configured to sequentially analysis, for every N stages, the multiple stages of quantized outputs to generate multiple digital codes. The skew calibration circuit is further configured to calibrate a time skew of the analog-to-digital converting system according to a comparison result between the multiple digital codes and a reference code.

Analog to digital converting system, time-skew calibration method, and related computer program product

A chip includes at least one oscillator circuitry and a controller circuitry. The at least one oscillator circuitry is disposed at different locations of the chip, and respectively generates a plurality of oscillating signals. The controller circuitry transmits the oscillating signals to an external system, in order to determine a performance of the chip based on the oscillating signals. Each of the at least one oscillator circuitry includes a first oscillator circuit and a second oscillator circuit. The first oscillator circuit senses a variation of a semiconductor device in the chip, in order to generate a first oscillating signal of the oscillating signals. The second oscillator circuit senses a variation of a parasitic component in the chip, in order to generate a second oscillating signal of the oscillating signals.

Chip and performance monitoring method

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Hsinchu, Taiwan

Ting-Hao Wang