Asix Electronics Corporation

Ting-Han Su

Hsun-Yao Jan

Cheng-Fang Yang

This invention relates to an advanced system and method of reprogrammable boot codes and In Application Programming (IAP) of embedded systems by booting up with boot loader to shadow program codes on to an internal high speed SRAM and extending contiguously to external higher space memory for runtime applications, and supporting on-line IAP to update run-time firmware or boot loader driver through network communication by utilizing advanced address remapping scheme as well as supporting In System Programming (ISP) to program initial Flash memory via ISP adaptor.

Method and systems for advanced reprogrammable boot codes and in-application programming of embedded microprocessor systems

The present invention discloses a reprogrammable built-in-self-test integrated circuit and a test method for the same, wherein test programs are directly stored in the application program memory of the logic chip of a SoC IC, and an external test apparatus is used to load the test programs into the application program memory via a serial transmission interface, and an application CPU is used to read and execute the test programs to perform the bonding-wire connectivity between the logic chip and the memory chip. In the present invention, test vectors can still be flexibly revised after tapeout to increase test coverage. As the test programs are directly stored in the existing application program memory without using additional memory space, and as the test programs are executed by the existing application CPU without using an extra built-in-self-test circuit, the present invention can effectively reduce test cost.

Growing community of inventors

Hsinchu, Taiwan

Ting-Han Su