Asm Assembly Automation Limited

Tin Yi Chan

Pei Wei Tsai

Chak Tong Albert Sze

Ho Yin Wong

A device handler for testing and sorting electronic devices has a testing station operative to test the electronic devices and to classify them according to different binning characteristics. A buffer assembly receives electronic devices which have been classified at the testing station, and the buffer assembly further comprises a first loading region having a plurality of receptacles and a second loading region having a plurality of receptacles. An output station is operative to unload electronic devices according to their different binning characteristics from either one of the first or second loading region of the buffer assembly for storage while electronic devices are being loaded onto the other loading region.

Growing community of inventors

Hong Kong, China

Tin Yi Chan