Battelle Energy Alliance, LLC

Hewlett-packard Development Company, L.p.

Virginia Commonwealth University

Bechtel Bwxt Idaho, Lcc

Timothy R McJunkin

Jill R Scott

David A Dahl

Craig G Rieger

Paul V Brownell

Herschel B Smartt

John A Johnson

Anthony D Appelhans

Paul L Tremblay

Eric D Larsen

John E Olson

Christopher D McBride

Kasun Amarasinghe

Milos Manic

Karen S Miller

Michael V McCarty

Andrew Jay Effenberger, Jr

Carla J Miller

Edward E Springer

A resilient security agent determines a cyber and/or physical health of a control system by, inter alia, communicating cyber-physical key data through cyber-physical control paths of the system, and determining error introduced by the communication. The resilient security agent may be further configured to verify the integrity of acquired cyber-physical state information. The cyber health of the control system may be evaluated by comparing the acquired cyber state information to one or more cyber state profiles. The physical health of the control system may be evaluated by comparing the acquired physical state information to one or more physical state profiles.

Systems and methods for control system security

An anomaly detector is configured to construct cyber and/or physical features comprising information configured to characterize the cyber and/or physical state of a cyber-physical system. The physical features may be based on physical and/or physics-based relationships between a plurality of physical state attributes. A health of the cyber-physical system may be based on an error between estimates of one or more of the physical state attributes and measurements of the one or more physical state attributes. The relationships may be incorporated into machine learning membership functions used to classify cyber and/or physical behavior of the system.

Anomaly detection for cyber-physical systems

A component security device may be disposed at an interface between a component and a cyber-physical system. The disclosed component security device may be physically and/or electrically coupled between the component and infrastructure of the cyber-physical system, such as a backplane, bus, and/or the like. The component security device may be configured to monitor the component, and selectively isolate the component from the cyber-physical system. Since the component security device is interposed at the interface of the component, the component security device may be capable of isolating the component regardless of whether the component has been compromised (e.g., regardless of whether the component is capable of complying with system commands).

In laser-induced breakdown spectroscopy (LIBS), an apparatus includes a pulsed laser configured to generate a pulsed laser signal toward a sample, a constructive interference object and an optical element, each located in a path of light from the sample. The constructive interference object is configured to generate constructive interference patterns of the light. The optical element is configured to disperse the light. A LIBS system includes a first and a second optical element, and a data acquisition module. The data acquisition module is configured to determine an isotope measurement based, at least in part, on light received by an image sensor from the first and second optical elements. A method for performing LIBS includes generating a pulsed laser on a sample to generate light from a plasma, generating constructive interference patterns of the light, and dispersing the light into a plurality of wavelengths.

Apparatus, system, and method for laser-induced breakdown spectroscopy

Apparatuses and methods relating to generating an electric field are disclosed. An electric field generator may include a semiconductive material configured in a physical shape substantially different from a shape of an electric field to be generated thereby. The electric field is generated when a voltage drop exists across the semiconductive material. A method for generating an electric field may include applying a voltage to a shaped semiconductive material to generate a complex, substantially nonlinear electric field. The shape of the complex, substantially nonlinear electric field may be configured for directing charged particles to a desired location. Other apparatuses and methods are disclosed.

Apparatuses and methods for generating electric fields

An ion cyclotron spectrometer may include a vacuum chamber that extends at least along a z-axis and means for producing a magnetic field within the vacuum chamber so that a magnetic field vector is generally parallel to the z-axis. The ion cyclotron spectrometer may also include means for producing a trapping electric field within the vacuum chamber. The trapping electric field may comprise a field potential that, when taken in cross-section along the z-axis, includes at least one section that is concave down and at least one section that is concave up so that ions traversing the field potential experience a net magnetron effect on a cyclotron frequency of the ions that is substantially equal to zero. Other apparatuses and a method for performing ion cyclotron spectrometry are also disclosed herein.

Method and apparatuses for ion cyclotron spectrometry

An ion cyclotron spectrometer may include a vacuum chamber that extends at least along a z-axis and means for producing a magnetic field within the vacuum chamber so that a magnetic field vector is generally parallel to the z-axis. The ion cyclotron spectrometer may also include means for producing a trapping electric field within the vacuum chamber that includes at least a first section that induces a first magnetron effect that increases a cyclotron frequency of an ion and at least a second section that induces a second magnetron effect that decreases the cyclotron frequency of an ion. The cyclotron frequency changes induced by the first and second magnetron effects substantially cancel one another so that an ion traversing the at least first and second sections will experience no net change in cyclotron frequency.

Method and apparatus for ion cyclotron spectrometry

An ion mobility spectrometer may include a flow channel having an inlet end and an outlet end. A deflection electrode is positioned within the flow channel so that a non-linear electric field is created between at least a portion of the flow channel and at least a portion of the deflection electrode when an electrostatic potential is placed across the deflection electrode and the flow channel. The ion mobility spectrometer also includes means for producing ions at a position upstream from the leading edge of the deflection electrode, so that ions produced thereby are deflected by the deflection electrode into the non-linear electric field. A detector positioned within the flow channel for detects ions from the non-linear electric field.

Continuous sampling ion mobility spectrometers and methods therefor

An ion mobility spectrometer may include an inner electrode and an outer electrode arranged so that at least a portion of the outer electrode surrounds at least a portion of the inner electrode and defines a drift space therebetween. The inner and outer electrodes are electrically insulated from one another so that a non-linear electric field is created in the drift space when an electric potential is placed on the inner and outer electrodes. An ion source operatively associated with the ion mobility spectrometer releases ions to the drift space defined between the inner and outer electrodes. A detector operatively associated with at least a portion of the outer electrode detects ions from the drift space.

Ion mobility spectrometers and methods for ion mobility spectrometry

Ion mobility spectrometer apparatus may include an ion interface that is operable to hold positive and negative ions and to simultaneously release positive and negative ions through respective positive and negative ion ports. A first drift chamber is operatively associated with the positive ion port of the ion interface and encloses an electric field therein. A first ion detector operatively associated with the first drift chamber detects positive ions from the first drift chamber. A second drift chamber is operatively associated with the negative ion port of the ion interface and encloses an electric field therein. A second ion detector operatively associated with the second drift chamber detects negative ions from said second drift chamber.

Dual mode ion mobility spectrometer and method for ion mobility spectrometry

A welding apparatus using ultrasonic sensing is described and which includes a movable welder having a selectively adjustable welding head for forming a partially completed weld in a weld seam defined between adjoining metal substrates; an ultrasonic assembly borne by the moveable welder and which is operable to generate an ultrasonic signal which is directed toward the partially completed weld, and is further reflected from same; and a controller electrically coupled with the ultrasonic assembly and controllably coupled with the welding head, and wherein the controller receives information regarding the ultrasonic signal and in response to the information optimally positions the welding head relative to the weld seam.

Welding apparatus and methods for using ultrasonic sensing

The preferred embodiments of the present invention are directed to the selective phase lag and time delay of clock signals within a computer system to compensate for additional parasitic capacitance that may be added to that system because of its open architecture. More particularly, the preferred embodiments are directed to clock signal path circuits where each circuit has multiple signal paths of varying lengths. By allowing the clock signals to propagate along a particular path, phase lag or time delay is added to those clock signals. Selection of a particular path for the clock signal is made by activating electrically controlled switches which themselves are activated or deactivated by software programs that run during power-up of the computer system that determine required phase lag or time delay of those clock signals as a function of parasitic capacitance in the computer system.

Adaptive clock skew in a variably loaded memory bus

System and method for adaptively adjusting clock skew in a variably loaded memory bus

A method for the concurrent ultrasonic inspection of partially completed welds is disclosed and which includes providing a pair of transducers which are individually positioned on the opposite sides of a partially completed weld to be inspected; moving the transducers along the length of and laterally inwardly and outwardly relative to the partially completed weld; pulsing the respective transducers to produce an ultrasonic signal which passes through or is reflected from the partially completed weld; receiving from the respective transducers ultrasonic signals which pass through or are reflected from the partially completed welds; and analyzing the ultrasonic signal which has passed through or is reflected from the partially completed weld to determine the presence of any weld defects.

Growing community of inventors

Idaho Falls, ID, United States of America

Timothy R McJunkin