Lenovo (singapore) Pte. Ltd.

International Business Machines Corporation

Timothy M Wiwel

Govindarajan Natarajan

Emmanuel Delamarche

Eric Alan Eckberg

James N Humenik

Marco Giovanni Trivella

Kathleen A McGroddy-Goetz

Scott Partington

Christopher F Perrera

Mehul M Shah

Wen Wei Tang

Wingcheung Tam

Jordan Hp Chin

Eric Richard Kern

Luke David Remis

Paul Andrew Wormsbecher

Camillo Sassano

Daniel Paul Kelaher

Paul Daniel Kangas

Glenn Edward Myrto

John Paul Scavuzzo

Ryuji Orita

Robert H Bass

Robert Diokno

Sarah E Smith

Matthew Weber

A memory system for a computer is provided as well as a method for integrity testing a memory interface. The memory system includes a memory controller providing a memory interface including a plurality of data lanes, wherein each of the plurality of data lanes includes a driver and a receiver, and wherein each receiver has an output. The memory system further includes an AND gate having an output and a plurality of inputs, wherein the output of each receiver is coupled to one of the plurality of inputs of the AND gate. The method includes driving a high signal pulse onto each of a plurality of data lanes of a memory interface, receiving a reflection of the high signal pulse on each of the data lanes, and determining whether the reflections received on the data lanes indicate that any one or more of the data lanes is defective.

Memory system for rapidly testing data lane integrity

In a method for ejecting a plurality of hot plug slots sharing a power controller, a processor receives a request to eject a plurality of hot plug slots, wherein the plurality of hot plug slots share a power controller and have at least two adapters present. A processor causes an OS to incrementally eject the at least two adapters, wherein ejecting an adapter comprises the OS stopping at least one driver of the adapter, and the OS generating a request to remove power from a hot plug slot. Responsive to a request by the OS to remove power from a hot plug slot, a processor generates a signal that prevents the OS from recognizing the adapter is present in the hot plug slot. Responsive to all device drivers for the at least two adapters being stopped, a processor causes power to be removed from the plurality of hot plug slots.

Hot removing an I/O module with multiple hot plug slots

A split chassis with a floating midplane carrier is provided. The split chassis is a modular electronic chassis which includes a first chassis section and a midplane carrier floatingly mounted to the first chassis section. The modular electronic chassis further includes a second chassis section mounted to the first chassis section, with the midplane carrier mounted between the first chassis section and the second chassis section.

Modular chassis with floating midplane carrier

A method uses time-domain reflectometry to measure a signal reflection delay in a conductive trace formed on a specific passive printed circuit board, and uses the measured signal reflection delay as an index into a table storing a predetermined association between signal reflection delay and passive printed circuit board manufacturing information, wherein the table includes a plurality of predetermined signal reflection delay values, and wherein each of the predetermined signal reflection delay values is associated with unique passive printed circuit board manufacturing information. During manufacturing of the passive printed circuit board, a hole is drilled through the passive printed circuit board so that the hole intersects with the conductive trace and divides the conductive trace into a proximal segment extending from the connector to the hole and a distal segment that is electrically isolated from the proximal segment by the hole.

Using time-domain reflectometry to identify manufacturing information for a passive printed circuit board

Preventing out-of-space errors for legacy option ROM in a computing system, including: iteratively for each option ROM in the computing system: loading, into an option ROM memory, the option ROM; executing, from the option ROM memory, the option ROM; and removing, from the option ROM memory, the option ROM.

Preventing out-of-space errors for legacy option ROM in a computing system

An apparatus, system, and method for determining the osmolarity of a fluid. The apparatus includes at least one micro-fluidic circuit and at least one electrical circuit disposed in communication with the micro-fluidic circuit for determining a property of a fluid contained within the at least one micro-fluidic circuit.

Micro-fluidic test apparatus and method

Embodiments of the present invention provide a method, system and computer program product for telephone call co-processing in a mobile telephony environment. In an embodiment of the invention, a method of telephone call co-processing in a mobile telephony environment is provided. The method includes monitoring a resource state of a selected mobile telephone, such as cellular network signal strength or battery charge. The method additionally includes detecting weakness of the resource state sufficient to inhibit the maintenance of a telephone call in the selected mobile telephone. Finally, the method includes, in response to detecting weakness of the resource state, identifying a different mobile telephone proximate to the selected mobile telephone and utilizing the different mobile telephone to process a telephone call.

Telephone call co-processing in for mobile telephones

An apparatus, system, and method for determining the osmolarity of a fluid. The apparatus includes at least one micro-fluidic circuit and at least one electrical circuit disposed in communication with the at least one micro-fluidic circuit for determining a property of a fluid contained within the at least one micro-fluidic circuit.

An apparatus, system and method for determining the osmolarity of a fluid. The system includes an apparatus having: a chip with a substantially planar top surface; a first circuit portion and a second circuit portion, each having a plurality of redundant electrically conductive lines disposed on the top surface; and a gap disposed between the first circuit portion and the second circuit portion, wherein a circuit is created when a fluid sample bridges the gap and connects the first circuit portion and the second circuit portion.

Fluidic test apparatus and method

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Raleigh, NC, United States of America

Timothy M Wiwel