International Business Machines Corporation

Timothy J Eby

Lisa Seacat DeLuca

Kulvir Singh Bhogal

Samuel I Ward

Travis M Grigsby

Frank Lawrence Jania

Michael John Hamilton

Norman Karl James

Jason T Albert

William T Bronk

Systems, methods and articles of manufacture are disclosed for recording events occurring in a virtual world. In one embodiment, properties of events previously recorded and/or attended by a user may be identified. Recording criteria for the user may be derived from the identified properties. Upon identifying an event satisfying the recording criteria, the event may be recorded. The recorded event may be played back at the convenience of the user.

Recording events in a virtual world

A predictive personal video recorder (PVR) can include a tuner, a buffer, a predictive tuner, and a predictive buffer. The tuner can be configured to allow viewing of a currently-selected digital video channel chosen from a plurality of digital video channels received by a predictive PVR. The buffer can be configured to store video data of the currently-selected digital video channel, allowing time-shifted viewing of the currently-selected digital video channel. The predictive tuner can be configured to capture video data for a predicted digital video channel. The predicted digital video channel can be selected based upon a predictive factor. The predictive buffer can be configured to store the captured video data for the predicted digital video channel received by the predictive tuner to allow time-shifted viewing of said predicted digital video channel.

Predictive personal video recorder operation

A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven.

Method of and system for functionally testing multiple devices in parallel in a burn-in-environment

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Austin, TX, United States of America

Timothy J Eby