General Electric Company

Ge Sensing & Inspection Technologies, Gmbh

Til Florian Guenzler

Michael Wuestenbecker

Ingo Stuke

Jan Kraemer

Holger Lux

Andreas Beyer

Nicolas Bretzke

Systems and methods are described that reduce the amount of data that is transferred among the components of the system. In one embodiment, the testing system comprises a scanner device such as a computed-tomography (CT) scanner that generates a volumetric representation of a part-under-inspection. The testing system is further configured to identify a region of interest in the volumetric representation, wherein the region of interest may correspond to an area of the part-under-inspection where a defect or flaw may form. The testing system may further format the data of the volumetric representation so the resulting formatted volumetric representation comprises less data than the original volumetric representation.

System for non-destructive testing and method for processing data generated therein

An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.

Apparatus for materials testing of test objects using X-rays

Growing community of inventors

Lingen, Germany

Til Florian Guenzler