Macronix International Co., Ltd.

Taiwan Semiconductor Manufacturing Comp. Ltd.

Tien-Yen Wang

Chun-Hsiung Hung

Chung-Cheng Chou

Chao-I Wu

Ming-Hsiu Lee

Hsiang-Lan Lung

Yen-Hao Shih

Chia-Jung Chen

Yun-Chen Chou

Hang-Ting Lue

Erh-Kun Lai

Hsin-Yi Ho

Dai-Ying Lee

Chun Hsiung Hung

Ming Hsiu Lee

Hsin Yi Ho

Jer-Hau Hsu

A system includes a charge pump system having a plurality of enable signal input terminals and an output terminal, the charge pump system configured to provide an output voltage at the output terminal; and a detection circuit connected to the enable terminals and the output terminal of the charge pump system, the detection circuit configured to compare the charge pump system output voltage to a plurality of predefined input detection voltage levels, and to selectively output a plurality of enable signals to the charge pump system enable signal input terminals in response to the comparison.

Charge pump system with low ripple output voltage

A sensing module, a memory device, and a sensing method are provided to perform a read operation so that the un-programmed/programmed state of a memory cell is identified. The sensing module includes a sensing amplifier and a current sink, and both are electrically connected to the memory cell. The sensing amplifier generates a sensing current and identifies the un-programmed/programmed state of the memory cell accordingly. The current sink receives a reference current being equivalent to the summation of the sensing current and a cell current flowing through the memory cell. The reference current is constant, and the sensing current is changed with the cell current. The cell current is generated based on a high read voltage and a low read voltage applied to the memory cell. The sensing current is higher if the memory cell is un-programmed, and the sensing current is lower if the memory cell is programmed.

Sensing module, memory device, and sensing method applied to identify un-programmed/programmed state of non-volatile memory cell

A memory device includes a memory array including a plurality of memory cells arranged in rows and columns. A closed loop bias generator is configured to output a column select signal to the memory array. A current limiter receives an output of the closed loop bias generator. The current limiter is coupled to a plurality of the columns of the memory array.

Memory device current limiter

At least one embodiment of the disclosure is directed to a memory circuit having a leakage current blocking mechanism and a memory device having the memory circuit. In an aspect, one embodiment of the disclosure describes a memory circuit which includes not limited to a memory array which includes a first memory cell connected to a first bit line and a second memory cell connected to a second bit line, a pre-charge circuit which is connected to the memory array and includes a first pre-charge device, and a programming circuit which is connected to the pre-charge circuit and comprises a programming transistor which has a higher drive capability than the first pre-charge device so as to drive the first bit line to a ground voltage in response to the first write operation, wherein in response to a first write operation on the first memory cell, a current flow exists between the programming circuit and the first pre-charge device.

Memory circuit with leakage current blocking mechanism and memory device having the memory circuit

A memory device and an operating method for a resistive memory cell are provided. The memory device includes the resistive memory cell. The resistive memory cell includes a first electrode, a second electrode and a memory film between the first electrode and the second electrode. The first electrode includes a bottom electrode portion and a sidewall electrode portion extending upwardly from the bottom electrode portion and between the memory film and the bottom electrode portion. A width of the sidewall electrode portion and a width of the memory film are smaller than a width of the bottom electrode portion.

Memory device and operating method for resistive memory cell

A sensing method for a memory is provided. The memory includes: a memory cell; a reference circuit generating a reference voltage and a clamp voltage; and a current supplying circuit receiving the clamp voltage to develop a cell current passing through the memory cell to form a cell voltage, wherein the cell voltage is used for incorporating with the reference voltage to determine the information stored in the memory.

Reference and sensing with bit line stepping method of memory

An operating method, an operating system and a resistance random access memory (ReRAM) are provided. The operating method includes the following steps. A write voltage and a write current are set at a first predetermined voltage value and a first predetermined current value respectively. The write voltage and the write current are applied to a memory cell of the ReRAM for writing. Whether the write current reaches a second predetermined current value is verified, if a read current of the memory cell is not within a predetermined current range. The write current is increased, if the write current does not reach the second predetermined current value. Whether the write voltage reaches a second predetermined voltage value is verified, if the write current reaches the second predetermined current value. The write voltage is increased, if the write voltage does not reach the second predetermined voltage value.

Resistance random access memory with accurate forming procedure, operating method thereof and operating system thereof

A method for managing memory includes setting a state of a first memory cell to a first state representing a first data and setting a state of a second memory cell to a second state representing the first data. If the state of the second memory cell has changed to a third state representing a second data different from the first data, the method also includes changing the state of the second memory cell back to the second state.

Memory and memory managing method

An array structure includes: a plurality of first signal lines and a plurality of sub-arrays. Each of the sub-array includes: a second signal line, a plurality of third signal lines, a plurality of fourth signal lines, a plurality of local decoders at each intersection of the first signal lines, the second signal line and the third signal lines; and a plurality of array cells at each intersection of the first signal lines, the third signal lines and the fourth signal lines. Respective control terminals of the local decoders are implemented by the first signal lines. In response to a selection status of the first signal lines and the second signal line, one of the local decoders selects one of the third signal lines.

Array structure having local decoders in an electronic device

An integrated circuit phase change memory can be pre-coded by inducing a first resistance state in some cells and the memory, and a second resistance state and some other cells in the memory to represent a data set. The integrated circuit phase change memory is mounted on a substrate after coding the data set. After mounting the integrated circuit phase change memory, the data set is read by sensing the first and second resistance states, and changing cells in the first resistance state to a third resistance state and changing cells in the second resistance state to a fourth resistance state. The first and second resistance states maintain a sensing margin after solder bonding or other thermal cycling process. The third and fourth resistance states are characterized by the ability to cause a transition using higher speed and lower power, suitable for a mission function of a circuit.

Phase change memory coding

A method for storing a data value in a memory cell is provided. The data value includes one of a first data value and a second data value respectively represented by a first and a second programmable resistance ranges. The method includes, within a write cycle, storing the first data value in the memory cell by applying a first verify operation having a first verify period and a first write operation having a first write period, or storing the second data value in the memory cell by applying a second verify operation having a second verify period longer than the first verify period and a second write operation having a second write period shorter than the first write period. The write cycle is shorter than a sum of the first write period and the second verify period.

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Zhubei, Taiwan

Tien-Yen Wang