Industrial Technology Research Institute

Tien-Yan Ma

Te-Mei Wang

Yu-Wei Chang

Shih-Fang Yang Mao

Ping-Chang Shih

A measurement system includes a camera and a processor. The camera is configured to capture a measurement card image of a measurement card, and the measurement card image includes a number of feature pattern images. The processor is electrically connected to the camera and configured for analyzing the feature pattern images to obtain a feature point coordinate of a feature point of each feature pattern image, and inputting the feature point coordinates into a conversion matrix to obtain a tip coordinate of a tip of the measurement card.

Measurement card, measurement system and measurement method using the same

A calibration method for an optical see-through display includes the following. An image sensing device is fixed at a standard position of an eye of a user seeing the optical see-through display, and the image sensing device is configured to photograph a virtual image displayed by the optical see-through display and an image of a real object in an environment. Extrinsic parameters between the image sensing device and a virtual camera are calculated by using extrinsic parameters between the image sensing device and multiple calibration patterns of the real object as well as extrinsic parameters between the virtual camera and the multiple calibration patterns of the real object. A calibration system is also provided.

Calibration method for optical see-through display and calibration system

A depth camera calibration device and a method thereof are provided. The method comprises: disabling a projection function of a camera and photographing surface planes to obtain a first image; enabling the projection function of the camera and photographing the surface planes to obtain a second image, and a positional relationship between the camera and a calibration plate assembly remaining unchanged when obtaining the first image and the second image; and obtaining parameters of the camera by cropping an image boundary, calculating positions of characteristic points, reading a projection pattern, calculating positions of corresponding points and excluding abnormal points according to the first image and the second image.

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Taipei, Taiwan

Tien-Yan Ma