Analog Devices,inc.

Intel Corporation

Tien Dinh

Charles P Roth

Ravi P Singh

Juan Guillermo Revilla

Sankaran M Menon

Thomas Tomazin

Luis Antonio Basto

Gregory A Overkamp

Ravi Kolagotla

The inputs to an embedded core, e.g., the core terminals, may not be directly connected to pins on the SoC. The lack of direct access to an embedded core's terminals may complicate testing of the embedded core. A test wrapper including boundary scan test (BST) cells may be used to test an embedded core. Dual function BST/ATPG (Automatic Test Pattern Generation) cells may be used to perform both BST and ATPG tests on embedded cores.

Method and apparatus for testing embedded cores

In one embodiment, a state machine receives a plurality of instructions from an instruction register to be processed by a digital signal processor. After receiving a single RTI, the state machine loads each of the plurality of instructions one at time and determines the validity of each instruction. If the instruction is valid, the state machine transfers the instruction to the decoder. If the instruction is invalid or if a no-operation instruction is present, the state machine discards the instruction and immediately loads the next instruction.

Efficient emulation instruction dispatch based on instruction width

Testing memory devices. An apparatus may include a test module operative to perform a test on a plurality of pipelined memory elements and a fail trace module operative to interrupt the test in response to identifying a failure of a memory element and to store an address of said memory element in a storage unit.

In one embodiment, an integrated circuit provides a test access port that communicates with scan chain registers in a processor core. The integrated circuit synchronizes data transferred between a debug controller that operates under control of a test clock (TCK) and the processor core that operates under control of a processor clock (CLK).

Growing community of inventors

Cedar Park, TX, United States of America

Tien Dinh