Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Ecole Polytechnique Federale De Lausanne

Carl-zeiss-smt Ag

Tiemo Anhut

Daniel Schwedt

Matthias Wald

Thomas Kalkbrenner

Tobias Kaufhold

Beate Böhme

Ralf Netz

Ralf Wolleschensky

David R Shafer

Helmut Lippert

Yauheni Novikau

Edoardo Charbon

Burkhard Roscher

Claudio Bruschini

Ivan Michel Antolovic

Wolfgang Singer

Daniel Haase

Jörg Siebenmorgen

Stefan Wilhelm

Nils Langholz

Frank Klemm

Peter Schacht

Lars-Christian Wittig

Matthias Langhorst

Thomas Mehner

Beate Boehme

Ulrich Preiβer

Beate BÖHME

Ulrich Preisser

An apparatus includes a detection beam path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths, with a detector being in each detection path. A microlens array is arranged upstream of at least one detector. The first detector has a first spatial resolution, and the second detector has a second spatial resolution that is lower than the first spatial resolution. Also, the first detector has a first temporal resolution, and the second detector has a second temporal resolution that is higher than the first temporal resolution. Captured image data and computationally combined to form a three-dimensionally resolved resulting image.

Apparatus and method for capturing image data

A device and a method for multi-spot scanning microscopy using a segmented color separator are disclosed, wherein a beam splitter is segmented laterally to a surface normal of the beam splitter into at least two filter fields for the selection of wavelength ranges and/or polarization directions. Individual partial illumination beams are thus each guided in an illumination beam path into a light spot on or in a simple to be examined and scanned over it. Detection light, which the sample emits in partial detection means after irradiation using the individual partial illumination beams, is guided onto a detection unit and detected thereby, wherein the partial illumination beams and/or the partial detection beams are each selected according to wavelength ranges and/or polarization directions by means of the beam splitter segmented laterally to a surface normal.

Device and method for multi-spot scanning microscopy

A light microscope has a light source for illuminating a specimen, a sensor array comprised of photon-counting detector elements for measuring detection light coming from the specimen, and a control device for controlling the sensor array. The control device is configured for flexibly binning the photon-counting detector elements into one or more super-pixels.

Light microscope with reconfigurable sensor array

An apparatus and method for light field microscopy. The apparatus has a light source for emitting excitation light, an excitation beam path for guiding the excitation light onto and into a sample, a two-dimensionally spatially resolving detector for detecting emission light emitted by the sample as a consequence of the irradiation by the excitation light, and a detection beam path having a microscope objective and a multi-lens array for guiding the emission light onto the two-dimensionally spatially resolving detector. The two-dimensionally spatially resolving detector being arranged in the focal plane of the multi-lens array or in a plane optically conjugate thereto, the excitation beam path being configured to illuminate only a portion of the sample in a field of view of the detection beam path with excitation light, with a device, in particular a scanner, being present for variable positioning of the illuminated portion of the sample in the field of view of the detection beam path and with a variable stop device being present. The variable stop device being configured to restrict an effective field of view of the detection beam path on the basis of the position of the illuminated portion in the field of view. The stop device is an electronic stop device and/or the stop device is arranged in an intermediate image plane of the detection beam path upstream of the multi-lens array.

Apparatus and method for light field microscopy

A method for evaluating measurement data from a light field microscope, and an apparatus for light field microscopy wherein the following steps are carried out: a) at least one sample position to be analyzed is selected in a sample; b) images of the sample, which each contain a set of partial images, are recorded at a sequence of recording times using a light field microscope; c) the positions corresponding to the selected sample positions are determined in the partial images of the images recorded in step b); d) the image signals are extracted from at least some of the partial images at the positions determined in partial step c); e) an integrated signal is obtained for a certain recording time by virtue of the image signals extracted for a certain position from partial images of this recording time in step d) being integrated to form the integrated signal; and f) a time profile of the integrated signal is obtained by virtue of step e) being carried out for a plurality of recording times.

Method for evaluating measurement data from a light field microscope, and apparatus for light field microscopy

A microscope and method of microscopy having a light source for providing illumination light, a controllable manipulation device for generating in a variable manner an illumination pattern of the illumination light to be selected, an illumination beam path with a microscope lens for guiding the illumination pattern to a sample to be examined, a detector having a plurality of pixels for examining the fluorescent light emitted by the sample, a detection beam path for guiding the fluorescent light emitted by the sample to the detector, a main beam splitter for splitting illumination light and fluorescent light, a control and evaluation unit for controlling the manipulation device and for evaluating the data measured by the detector. The manipulation device is arranged in the illumination beam path upstream from the main beam splitter such that the pixel of the detector can be individually activated using the control and evaluation unit and in read out patterns to be selected.

Microscope and method of microscopy for providing illumination light and generating an illumination pattern

The invention relates to a microscope having an excitation beam path for guiding excitation light, having a laser light source for providing a laser light beam as excitation light and having a scanning apparatus for aligning and moving a focused laser light beam in the entrance pupil of an illumination objective; wherein the laser focus is directed into an entrance point that is offset with respect to the optical axis of the illumination objective; and also having a detection beam path for guiding detection light, comprising a microlens array having a focal plane for generating partial imaged presentations and a detector arranged in the focal plane of the microlens array for capturing the partial imaged presentations. In addition, an evaluation unit for evaluating the captured image signals of the detector in accordance with light-field technology is present. The invention additionally relates to a method for microscopic image generation.

Microscope and method for microscopic image recording with variable illumination

A light microscope has a light source for illuminating a specimen, a photon-counting detector array with a plurality of photon-counting detector elements for measuring detection light coming from the specimen, wherein the photon-counting detector elements are configured to output respective measured photon count rates, and a control device for controlling the photon-counting detector array. The control device is configured to individually influence the measurable photon count rates which are simultaneously measurable with different photon-counting detector elements and/or which are consecutively measurable with the same photon-counting detector element. Furthermore, in an imaging method the measurable photon count rates of photon-counting detector elements are individually influenced to increase the signal-to-noise ratio for the photon-counting detector array.

Light microscope with photon-counting detector elements and imaging method

A device includes a detection path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths. A detector has detector elements in each detection path. A microlens array is disposed upstream of each detector in a pupil. The first and second detectors have a substantially identical spatial resolution. The detector elements of the first detector are arranged line by line in a first line direction, while the detector elements of the second detector are arranged line by line in a second line direction. The first and second detectors are arranged relative to the image to be captured such that the first and second line directions are inclined relative to one another. A readout unit for reading out the image data of the detectors is configured for selectively reading those detector elements arranged line by line which form an image line.

Device and method for rapid three-dimensional capture of image data

A light microscope and a method for capturing images with a light microscope includes guiding illumination light to a sample; guiding detection light from the sample to a plurality of photon-counting sensor elements, which each successively capture a plurality of photon counts; forming a plurality of photon count distributions to be analyzed and at least one reference photon count distribution from the photon counts; calculating a similarity between each photon count distribution to be analyzed and the reference photon count distribution; and identifying sensor elements as overdriven as a function of the calculated similarity of the corresponding photon count distribution(s) to be analyzed.

Light microscope and method of capturing images with a light microscope

A light microscope having a scanner for scanning a sample with illuminating light and a light detector for measuring sample light. A microlens array having a plurality of microlenses is arranged in front of the light detector in the region of a pupil plane. The light detector respectively has a plurality of detector elements behind each microlens and has a complete readout frequency of at least 100 kHz. By means of the detector elements arranged behind the respective microlens, a wavefront datum regarding the sample light is determined. Moreover, a sample point signal is computed from signals of the detector elements. Illuminating light is successively deflected onto different sample points with the scanner and corresponding sample point signals are captured, wherein, for at least some of the different sample points, a corresponding wavefront datum is also determined. The determined wavefront data can be taken into account in a calculation of a sample image from the plurality of sample point signals.

Light microscope and microscopy method

Detecting emission light, in a laser scanning microscope, wherein the emission light emanating from a sample is guided onto a two-dimensional matrix sensor having a plurality of pixels and being located on an image plane, and a detection point distribution function is detected by the matrix sensor in a spatially oversam pled manner. The emission light emanating from the sample is spectrally separated in a dispersion device; the spectrally separated emission light is detected by the matrix sensor in a spectrally resolved manner; and during the analysis of the intensities measured by the pixels of a pixel region, the spectral separation is cancelled at least for some of said pixels. Additional aspects relate to a detection device for the spectrally resolved detection of emission light in a laser scanning microscope and to a laser scanning microscope.

Method for detecting emission light, detection device and laser scanning microscope

A microscope, which includes a color splitter that is reflective to excitation radiation, can switch between a first and a second operating mode. A first apparatus can introduce a first cylindrical optical element into the excitation beam path between a light source and the color splitter, when the microscope is in the first operating mode, and a second apparatus can introduce a second cylindrical optical element into the excitation beam path between the color splitter and a scanning apparatus.

Microscope and method for light-field microscopy with light-sheet excitation and for confocal microscopy

An optical assembly in a laser scanning microscope, having an optical scanning unit providing a first pupil plane, a first beam deflecting device, made of a first scanner arranged on the first pupil plane, for scanning excitation radiation in a first coordinate direction, a first focusing device generating a second pupil plane, optically conjugated to the first pupil plane, and a second beam deflecting device for deflecting the excitation radiation. The second deflecting device is arranged on the second pupil plane. A second focusing device to generate a third pupil plane, is optically conjugated to the first pupil plane and the second pupil plane. A third beam deflecting device is arranged on the third pupil plane, and a variable beam deflecting device is provided to switch an optical beam path between a first beam path and a second beam path.

Optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope, and laser scanning microscope

The invention relates to a beam manipulation device for a scanning microscope, comprising a main colour splitter for coupling excitation light into an illumination beam path and for separating excitation light from detection light of a detection beam path, said device comprising a scanner, preferably positioned on a pupil plane, for scanning the excitation light. The device is characterised in that: an additional optical section is provided comprising optical elements which influence a beam path; at least one pupil plane and/or at least one intermediate image plane is formed in the additional optical section by the optical elements which influence the beam path; and an adjustable selection device is provided for activating either a first beam segment of the illumination and/or detection beam path, or the additional optical section, wherein the first beam segment of the illumination and/or detection beam path does not contain a pupil plane of the illumination and/or detection beam path.

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Jena, Germany

Tiemo Anhut