Molecular Imaging Corporation

Arizona Board of Regents, a Body Corporate

Other

Agilent Technologies, Inc.

Biosensing Instrument, Inc.

Molecular Imaging Corporation Arizona Board of Regents

Tianwei Jing

Stuart Lindsay

Wenhai Han

Alexander A Gall

Yuri L Lyubchenko

Nguyen Ly

Nongjian Tao

Steven K Harbaugh

Christian Rankl

Asger Iversen

Feimeng Zhou

A system in an embodiment can comprise an optical assembly, an surface-plasmon-resonance (SPR) light source, and an SPR camera. The optical assembly can comprise a hemispherical prism comprising a top surface configured to support a SPR sensor; and a high numerical aperture (NA) lens located distal from the top surface of the hemispherical prism. The SPR light source can be configured to emit a light beam for SPR imaging. The SPR camera can be configured to capture an SPR image. The SPR sensor further can comprise a surface configured to contact a sample. The high NA lens can be configured to refract the light beam toward the hemispherical prism. The hemispherical prism can be configured to collimate the light beam, as refracted by the high NA lens, toward the SPR sensor. The high NA lens further can be configured to receive and refract the light beam toward the SPR camera, after the light beam is reflected by the surface of the SPR sensor. Other embodiments are disclosed.

Surface plasmon resonance imaging system and method for measuring molecular interactions

A system in an embodiment can comprise an optical assembly, an SPR light source, and an SPR camera. The optical assembly in this embodiment can comprise a hemispherical prism comprising a planar top surface configured to support a surface-plasmon-resonance (SPR) sensor; a high numerical aperture (NA) lens; and a housing configured to mount the hemispherical prism and the high NA lens the such that the high NA lens is located distal from the planar top surface of the hemispherical prism. The SPR light source in this embodiment can be configured to emit a low-coherent monochromatic light beam for SPR imaging toward the high NA lens. The SPR camera in this embodiment can be configured to capture an SPR image formed after the low-coherent monochromatic light beam is incident upon and reflected by a metal-coated sample contacting surface of the SPR sensor. Additionally, the high NA lens in this embodiment can be configured to refract the low-coherent monochromatic light beam from the SPR light source toward the hemispherical prism; and the hemispherical prism can be configured to collimate the low-coherent monochromatic light beam, as refracted by the high NA lens, toward the SPR sensor. Other embodiments are disclosed.

A method for optically controlling an atomic force microscope (AFM) includes acquiring an optical image of a sample using an optical imaging device, identifying a feature of interest on the sample using the optical image, acquiring a high resolution AFM image of the sample using an AFM imaging device, the AFM imaging device comprising a cantilever having a tip, overlaying the AFM image with the optical image at the feature of interest, and positioning the probe tip over the feature of interest using the optical image.

Controlling atomic force microscope using optical imaging

An apparatus for detecting one or more substances includes a radiation source emitting a beam of radiation and also includes a material capable of reflecting the beam of radiation with a first characteristic and capable of reflecting the beam of radiation with a second characteristic when the material interacts with the one or more substances. The apparatus also includes two or more radiation detectors to detect the first and second characteristics of the beam of radiation. A first one of the two or more radiation detectors is adjustably aligned to detect the first and second characteristics of the beam of radiation reflected from a first region of the material. A second one of the two or more radiation detectors is adjustably aligned to detect the first and second characteristics of the beam of radiation reflected from a second region of the material.

Apparatus for detecting one or more substances and method of detecting a substance

A fast translation stage for a scanning probe microscope is provided. The stage includes at least one axis of translation driven at the natural resonant frequency of the translation stage such that distortion associated with rapid changes in scan direction is avoided. In one embodiment, the stage includes a sample plate or support that is driven, preferably by one or more piezoelectric actuator elements, so that the plate translates along the fast scan frequency at its resonant frequency.

Fast scanning stage for a scanning probe microscope

A pendulum scanner that utilizes a rocking motion to scan across a sample surface is provided. The scanner is present as a component in a scanning probe microscope that includes a microscope base, an optical stage, and a sample stage. The optical stage includes a source of a collimated beam of light, at least one beam tracking element, and a first scanning element for generating movement of the optical stage in a first plane. The microscope also includes a cantilever probe having a light-reflective surface. A second scanning element is provided for generating movement of the optical stage in a second plane that is orthogonal to the first plane. A position sensitive detector is also provided and is adapted to receive a beam of light reflected from the surface of the cantilever probe and to produce a signal that is indicative of the angular movement of the reflected beam of light.

Pendulum scanner for scanning probe microscope

A combined scanning probe and optical microscope is provided. The microscope comprises a sample stage, a scanning probe microscope, an optical microscope, a microscope coupling, and a sample stage support. The microscope coupling, the sample stage, and the sample stage support are arranged to inhibit relative motion between the sample stage and the scanning probe microscope in the event of simultaneous low frequency vibrations in the optical microscope and high frequency vibrations in the scanning probe microscope. In accordance with other embodiments of the present invention scanning probe microscopes are provided comprising a slide-mounted stage assembly, a solenoid unit positioned above the cantilever unit of the probe, and a specialized solenoid driven cantilever assembly.

Scanning probe microscope and solenoid driven cantilever assembly

A scanning probe microscope is provided for measuring at least one characteristic of a surface, the microscope including a force sensing probe which is responsive to the at least one characteristic of the surface, an oscillator which moves the position of the probe relative to the surface, a voltage source for establishing an electrical potential between the force sensing probe and the surface, and a detector which detects the oscillating component of the electrical current flow into or out of the probe as a measure of the at least one characteristic of the surface. The microscope can be operated to simultaneously acquire both electrical and topographical information from a surface of a substrate.

Vibrating tip conducting probe microscope

A scanning probe microscope for generating a signal corresponding to the surface characteristics of a scanned sample is provided and includes a force sensing probe tip disposed on a first side of a free end of a flexible cantilever which is adapted to be brought into close proximity to a sample surface; a magnetized material disposed on a second side opposite the first side of the flexible cantilever; an XY scanner for generating relative scanning movement between the force sensing probe tip and the sample surface; a Z control for adjusting the distance between the force sensing probe tip and the sample surface; and a deflection detector for generating a deflection signal indicative of deflection of the flexible cantilever. The scanning probe microscope also includes an ac signal source and a magnetic field generator for generating a magnetic field, with the magnetic field generator being coupled to the ac signal source so as to modulate the magnetic field with the ac signal. The force-sensing cantilever is magnetized with a moment along the soft axis of the cantilever.

Magnetic modulation of force sensor for AC detection in an atomic force

Force sensing probes for use in scanning probe microscopes and a method for coating such probes with a film comprising a magnetostrictive material are provided. The probes may be magnetized by placing them in a magnetic field which can be oriented in any direction with respect to the probes. The magnetostrictive effect leads to a compression or expansion of the magnetic film, altering its length by the strength of the applied field. This in turn causes the probe, which in a preferred embodiment is in the form of a cantilever, and the applied magnetic film, to deflect or bend. The consequent motion of the probe is much greater than that obtained by direct application of a magnetic force and the effect is not sensitive to the direction of the applied field.

Force sensing probe for scanning probe microscopy

A scanning probe microscope for measuring the characteristics of a surface of a sample is provided and includes a probe for scanning the surface of a sample to be measured and a sample stage which is adapted to position a sample in the microscope. In a preferred embodiment, the microscope is a conducting atomic force microscope. The microscope also includes a source of voltage in communication with the probe and the sample and a detector for measuring the electrical current to or from the probe and the sample. The probe and the sample are positioned within an enclosure which isolates the probe and the sample from the ambient environment, and the enclosure includes a gas inlet and a gas outlet for controlling the environment in the enclosure to maintain the atmosphere in the enclosure at approximately atmospheric pressure.

Conducting scanning probe microscope with environmental control

A tip coating system for use with scanning tunneling microscope (STM) tips. The tip coating system includes a tip holder, a plate having a slot for receiving the tip and for holding a coating material, a heater for heating the coating material into a molten blob, a micropositioner for displacing the plate to and from the tip and for moving the tip within the slot so that selected portions of the tip contact the molten blob of coating material. The tip coating system is preferably controlled by electronic controllers, including a temperature controller for the heater. The tip coating system is used to insulate the tips with soft polymer coating material to ensure very low tip leakage current (on the order of about 1 pA typical).

Tip coating system for scanning probe microscopy

An atomic force microscope and method of operation are provided and include a force sensing probe tip adapted to be brought into close proximity with a sample surface, a scanning element for generating relative movement between the probe tip and the sample surface, a device for generating a magnetic field to cause deflection of the probe tip, a driver for the device, the driver including a source of alternating current and a source of a second current of a controlled magnitude, and a detector for detecting the position of the probe tip. In a preferred mode of operation, two signals, one of alternating current and the other of a fixed, but variable, current, are applied to cause a displacement of the time-average position of the probe tip.

Microscope for compliance measurement

A force sensing cantilever for use in a scanning probe microscope has both a top side and a bottom side. From the bottom side extends a probe tip. The bottom side is coated with a thin film of a first material and the top side is coated with a thin film of a second material. The first and second materials may be the same or they may be different. The materials and thicknesses of the respective films are selected so as to create opposing forces to counter the tendency of such cantilevers to bend when a thin film is applied to only one side thereof.

Cantilevers for a magnetically driven atomic force microscope

A heater for use in heating a sample stage of a microscope such as a scanning probe microscope is bonded to a sample stage which sits on a tube of a ceramic thermal insulator which is, in turn, mounted within or part of a tube of the same material. This re-entrant design provides an increased thermal path over straight line distances between the heater and the support structure for the sample stage and thus provides excellent thermal insulation, while also maximizing the thermal stability of the system.

Growing community of inventors

Tempe, AZ, United States of America

Tianwei Jing