Ge Global Sourcing LLC

Tianshao Ni

Bradley Dale Brown

Richard Burchill

Edward Lommen

Cory Sholikowski

Johann Sawatzky

Michael Procca

A strain sensor system emits coarse interrogation signals of different frequencies during a coarse scan while an RF resonant sensor and/or an RF interrogator moves relative to the other. The sensor emits responsive RF signals within a frequency range of a frequency of interest of the sensor. The controller identifies the frequency of interest based on receipt of the responsive signals. The interrogator emits fine interrogation signals of different frequencies during a fine scan subsequent to the coarse scan. The fine signals are emitted at frequencies within a frequency band on both sides of the frequency of interest. The sensor emits responsive RF signals and the controller identifies a center frequency of the RF resonant sensor based on receipt of the responsive signals.

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Winnipeg, Canada

Tianshao Ni