Gowin Semiconductor Corporation

Tianping Wang

Jinghui Zhu

Jianhua Liu

Chienkuang Chen

Diwakar Chopperla

Ning Song

Xiaozhi Lin

Zhenyu Gu

Tianxin Wang

Jingxiang Wang

Yunjie Fan

Yue Han

Qi Zhou

Niu Li

Zheng Wang

A system and method for testing Error Correcting Code ('ECC') function of Field Programmable Gate Array (“FPGA”) on-chip block random access memory (“BRAM”) includes control modules, at least two BRAMs with ECC function and sequentially connected to form a ring, and parity bit comparison modules corresponding to each BRAM. Each parity bit comparison module is connected to its corresponding BRAM and the next adjacent BRAM. The control module is used to send data read and write test instructions to each BRAM. Each BRAM is used to read test data sequentially, write test data into next adjacent BRAM whenever the test data is read, and send the first parity bit generated during reading to the corresponding parity bit comparison module. Each parity bit comparison module is used to compare the first and second parity bits, where the second parity bit is generated during the writing of test data. The embodiments of the present invention reduce the required test stimuli and the interactions with upper computer ports, which enhances the test efficiency.

Method and apparatus for testing error correcting code (ECC) function of FPGA on-chip block random access memory (BRAM)

A configurable semiconductor device ('CSD') is organized in four (4) quadrants able to perform user-defined logic functions via a clock fabric. The first quadrant, in one embodiment, includes a first serializer and deserializer (“SerDes”) region and a bank0 region for data processing. The second quadrant includes a second SerDes region and a bank5 region and the third quadrant contains a bank3 region and a bank4 region. The fourth quadrant includes a bank1 region and a bank2 region. The clock fabric is configured to provide a set of programmable or selectable clock signals with different clock speeds to various regions within the CSD.

Method and system for organizing programmable semiconductor device into multiple clock regions

A configurable semiconductor device ('CSD') is organized in four (4) quadrants able to perform user-defined logic functions via a clock fabric. The first quadrant, in one embodiment, includes a first serializer and deserializer ('SerDes') region and a bank0 region for data processing. The second quadrant includes a second SerDes region and a bank5 region and the third quadrant contains a bank3 region and a bank4 region. The fourth quadrant includes a bank1 region and a bank2 region. The clock fabric is configured to provide a set of programmable or selectable clock signals with different clock speeds to various regions within the CSD.

Methods and apparatus for organizing a programmable semiconductor device into multiple clock regions

A field-programmable gate array ('FPGA') contains a configurable semiconductor organized in multiple clock regions with a clock fabric for facilitating user-defined logic functions. The clock fabric provides a set of regional clock signals ('RCSs') generated from a clock source with a high clock signal quality (&#x201c;CSQ&#x201d;) for clocking logic blocks in a clock region. Also, a set of neighboring clock signals (&#x201c;NCSs&#x201d;) or inter-regional clock signals are generated from a neighboring clock source(s) for clocking logic blocks in two neighboring regions. In addition, the clock fabric is operable to provide secondary clock signals (&#x201c;SCSs&#x201d;) generated from the RCSs with a low CSQ for clocking logic blocks with less time-sensitive logic operations.

Methods and apparatus for providing a clock fabric for an FPGA organized in multiple clock regions

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Shanghai, China

Tianping Wang