Boe Technology Group Co., Ltd.

China Petroleum Chemical Corporation

Beijing University of Technology

Research Institute of Petroleum Processing, Sinopec

Beijing Zhongxiangying Technology Co., Ltd.

Tian Lan

Haohan Wu

Dong Chai

Guoliang Shen

Yue Tang

Hong Wang

Fei Yuan

Jianmin Wu

Weihe Liu

Xin Wang

Yu Wang

Tao Liu

Yu Feng

Fan Zhang

Zhiyong Wang

Hong Nie

Youhao Xu

Dadong Li

Jing Xue

Chuan Wang

Lishun Dai

Haijin Wang

Jianfeng Zeng

Xuefeng Kan

Jingjing Dai

Jiawei Ren

Jianzhou Wang

Yingli Zeng

Guanchun Bai

The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

Methods and devices for processing and retrieving defect information of product

The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.

System and method for producing display panels based on nonlinear program model, and non-transitory computer-readable storage medium

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to defects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system

A computer-implemented method for defect analysis is provided. The computer-implemented method includes calculating a plurality of weight-of-evidence (WOE) scores respectively for a plurality of device operations with respect to detects occurred during a fabrication period, a higher WOE score indicating a higher correlation between a defect and a device operation; and ranking the plurality of WOE scores to obtain a list of selected device operations highly correlated with the defects occurred during the fabrication period, device operations in the list of selected device operations having a WOE score greater than a first threshold score. A respective one of the plurality of device operations is a respective device defined by a respective operation site at which the respective device perform a respective operation.

According to the embodiments of the present disclosure, there is provided a method and device of detecting fault in production, and a computer readable storage medium. The method includes: determining whether a plurality of production paths in a production line are faultless in one or more production batches, based on production record data; and determining at least one of the plurality of production paths to be faulty, at least partially based on whether the plurality of production paths are faultless in the one or more production batches.

Method and device of detecting fault in production

A data management platform for intelligently managing data is provided. The data management platform includes an ETL module configured to extract, cleanse, transform, or load data; a data lake configured to store a first group of data formed by extracting raw data from a plurality of data sources by the ETL module; a data warehouse configured to store a second group of data formed by cleansing and standardizing on the first group of data; a general data layer configured to store a third group of data formed by subjecting the second group of data to data fusion; and a data mart configured to store a fourth group of data formed by transforming the third group of data by the ETL module. The general data layer is a distributed data storage storing information available for querying. The data mart is a database of NoSQL type storing information available for computational processing.

Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis

A system for recommending a maximum quantity of work in process, in which one or more processors of a distributed storage device are configured to execute: acquiring at least part of production data stored in the distributed storage device, the production data includes quantity records and cycle time records of a production line in time periods, and the cycle time record of each time period includes a cycle time at each process station of the production line in said each time period; clustering the quantity records to obtain a plurality of initial classifications, each initial classification includes at least one quantity record; determining a portion of the initial classifications as preferred classifications; determining the maximum quantity of work in process at each process station; and a display device is configured to display the maximum quantity of work in process at each process station determined by an analysis device.

System and method for recommending maximum quantity of work in process, and computer readable medium

Provided are a method for transferring a compound semiconductor single crystal thin film layer and a method for preparing a single crystal GaAs&#x2014;OI composite wafer, including: preparing a graphite transition layer on a first substrate; growing the compound semiconductor single crystal thin film layer on the graphite transition layer; preparing a first dielectric layer on the compound semiconductor single crystal thin film layer; preparing a second dielectric layer on a second substrate; combining the first substrate and the second substrate by bonding the first dielectric layer and the second dielectric layer; applying a lateral external pressure, such that the compound semiconductor single crystal thin film layer and the first substrate are transversely split at the graphite transition layer, and the compound semiconductor single crystal thin film layer is transferred to the second substrate.

Method for transferring compound semiconductor single crystal thin film layer and method for preparing single crystal GaAs-OI composite wafer

A process for converting inferior feedstock oil includes several steps. In step a) the inferior feedstock oil is subjected to a low severity hydrogenation reaction. The reaction product is separated to produce a gas, a hydrogenated naphtha, a hydrogenated diesel and a hydrogenated residual oil. In step b) the hydrogenated residual oil obtained in step a) is subjected to a first catalytic cracking reaction, the reaction product is separated to produce a first dry gas, a first LPG, a first gasoline, a first diesel and a first FCC-gas oil. In step c) the first FCC-gas oil obtained in step b) is subjected to a hydrogenation reaction of gas oil, the reaction product is separated to produce a hydrogenated gas oil, and in step d) the hydrogenated gas oil obtained in step c) is subjected to the first catalytic cracking reaction of step b) or a second catalytic cracking reaction.

Process for converting inferior feedstock oil

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