Diamontech Ag

Diamontech Gmbh

Thorsten Lubinski

Alexander Bauer

Otto Hertzberg

Werner Mäntele

Uwe Schriek

Sergius Janik

An apparatus for analyzing a material includes an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

Device and method for analyzing a material

The invention relates to a device and a method for analyzing a substance (), comprising an excitation transmitting device in the form of a laser device () for generating at least one electromagnetic excitation beam (), a measuring body () having a detection region (), which is adjacent to a measuring surface () of the measuring body () and has a pressure-dependent or temperature-dependent specific electrical resistance and/or generates electrical, in particular piezoelectric, voltage signals in the event of pressure or temperature changes, and comprising a device for analyzing the substance on the basis of detected signals.

Device and method for analyzing a substance

The invention relates, inter alia, to a device () for analysing a material (), comprising an excitation emission device () for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device () for detecting a reaction signal (SR), and a device () for analysing the material on the basis of the detected reaction signal (SR).

The invention relates, inter alia, to an apparatus () for analyzing a material (), comprising an excitation emission device () for generating at least one electromagnetic excitation beam (SA), in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device () for detecting a reaction signal (SR), and a device () for analyzing the material on the basis of the detected reaction signal (SR).

Apparatus and method for analyzing a material

The invention relates to an apparatus for analyzing a material comprising an excitation emission device for generating at least one electromagnetic excitation beam, in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device for detecting a reaction signal, and a device for analyzing the material on the basis of the detected reaction signal.

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Berlin, Germany

Thorsten Lubinski