Dspace Digital Signal Processing and Control Engineering Gmbh

Thomas Woelfer

Robert Leinfellner

Ralf Grosse Boerger

Nicola Bruski

Eduard Miller

Jobst Richert

Holger Krisp

The present invention relates to a test device for testing a control system and an associated method for operating the test device. The test device includes an addressable memory. The test device is configured to calculate at least one environment model and to execute at least one test model. The environment model is described by environment model variables whose values are filed at fixed physical addresses in memory locations of the memory. The test device further comprises an allocation unit, in which the allocation of all or a part of the environment model variable to the allocated physical addresses of the memory is filed such that the test model can read the allocation of the environment model variables to their specific memory addresses so as to modify the environment model variable values in the environment model during its execution.

System for testing at least one electronic control unit and method

A method is presented and described for testing of at least one electronic control system, in which the control system is connected via a data channel to a test device, at least one environmental model is calculated on the test device and the environmental model interacts with the control system by output of environment model data via the test device to the control system and by receiving control system data from the control system via the data channel. The method according to the invention executes on the test device at least one test model to influence the environment model and/or to calculate the environment model and/or the electronic control system, in which the test model or the test models is or are executed functionally independently of the environment model and, during test operation, synchronously with the environment model.

Method for testing an electronic control system

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Paderborn, Germany

Thomas Woelfer