Corning Incorporated

Thomas W Parks

Patrick S Lee

Raymond C Logue

Annette L Vandervort

Frederic P Fischer

A method for detecting reflection-type discontinuities in an optical waveguide fiber, such as those produced by a fiber break, a contaminant in the glass making up the fiber, a microbend, or a mechanical splice or connector, is provided. The method employs an optical time domain reflectometer (OTDR) and involves cross-correlating an OTDR trace or a modified OTDR trace, e.g., one from which fiber attenuation has been subtracted, with a predetermined waveform which is characteristic of a reflection-type discontinuity. The predetermined waveform can compensate for differences between the noise spectrum of the OTDR trace and white noise. In particular, a predetermined waveform obtained by backward differencing and then forwarding differencing an average of waveforms known to correspond to reflection-type discontinuities is able to provide such white noise compensation.

Method for testing optical waveguide fibers to detect reflection type

Methods for measuring the diameters of transparent filaments with high precision, e.g., RMS standard deviations of less than 0.02 microns, are provided. The methods involve determining the average spatial frequency .omega. of the far-field interference pattern produced by illuminating the filament with a beam of laser light. The average spatial frequency is determined by performing a fast Fourier transform (FFT) on the interference data to obtain a coarse estimate for the average and then performing a set of discrete sequence Fourier transforms (DSFTs) in the region of the coarse estimate to obtain the desired high precision estimate of the average. Efficient on-line processing procedures are provided so that real time measurements can be performed on, for example, a moving optical waveguide fiber, at rates of 500 measurements/second and above.

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Ithaca, NY, United States of America

Thomas W Parks